Agilex™ 7 FPGAs and SoC FPGAs Package, Pinout, and PCB Design User Guide

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ID 814028
Date 6/07/2024
Public
Document Table of Contents
Document Table of Contents x
1. Introduction 2. Product Family Plan 3. Package Information 4. Thermal Design Considerations 5. Pin Connection Guidelines and Pinouts 6. Printed Circuit Board (PCB) Design 7. Signal Integrity Simulations 8. Validation 9. Document Revision History for the Agilex™ 7 FPGAs and SoC FPGAs Package, Pinout, and PCB Design User Guide
1. Introduction x
1.1. Status Definitions 1.2. Notifications 1.3. Secure Asset Access—Developer Zone Premium (DZP)
2. Product Family Plan x
2.1. Product Table Information 2.2. Part Number Decoder 2.3. Series/Package/Tile Comparison Table 2.4. Migration within a Package 2.5. Series Package Options Versus Tiles—Support I/O Counts 2.6. Package Comparison Tables
2.5. Series Package Options Versus Tiles—Support I/O Counts x
2.5.1. Agilex™ 7 F-Series Devices with F-Tiles 2.5.2. Agilex™ 7 F-Series Devices with E-Tile and P-Tiles 2.5.3. Agilex™ 7 I-Series Devices with F-Tiles 2.5.4. Agilex™ 7 I-Series Devices with F-Tiles and R-Tiles 2.5.5. Agilex™ 7 M-Series Devices with HBM2e 2.5.6. Agilex™ 7 M-Series Devices without HBM2e
3. Package Information x
3.1. Ball Grid Array (BGA) Package
3.1. Ball Grid Array (BGA) Package x
3.1.1. Package Mechanical Drawings 3.1.2. Package Ball Coordinates 3.1.3. Package PCB Footprints 3.1.4. Land Pattern PCB Design Recommendations (MAS)
4. Thermal Design Considerations x
4.1. Power Estimation and Analysis Tools 4.2. Compact Thermal Models (CTM) 4.3. Heat Sink 4.4. Remote Temperature Sensing using Temperature Sensing Diodes (TSDs)
4.1. Power Estimation and Analysis Tools x
4.1.1. Intel® FPGA Power and Thermal Calculator (PTC) 4.1.2. Quartus® Prime Power Analyzer (QPA)
4.3. Heat Sink x
4.3.1. Heat Sink Rework
5. Pin Connection Guidelines and Pinouts x
5.1. Pin Connection Guidelines 5.2. Pinout Introduction 5.3. I/O Banks 5.4. Transceivers 5.5. Validating Pins
5.2. Pinout Introduction x
5.2.1. F-Series Pinouts 5.2.2. I-Series Pinouts 5.2.3. M-Series Pinouts 5.2.4. Hard Processor System (HPS) Pin Information 5.2.5. External Memory Interface (EMIF) Pin Information
5.3. I/O Banks x
5.3.1. Types of Banks 5.3.2. Bank Locations 5.3.3. Selecting Bank Usage
5.3.1. Types of Banks x
5.3.1.1. General-purpose I/O (GPIO) 5.3.1.2. Secure Device Manager (SDM) I/O 5.3.1.3. Hard Processor System (HPS) I/O
5.3.3. Selecting Bank Usage x
5.3.3.1. Agilex™ 7 M-Series FPGA I/O Placement
6. Printed Circuit Board (PCB) Design x
6.1. Schematic Symbols 6.2. Power Supply 6.3. External Memory 6.4. Transceivers 6.5. SoC FPGA Hard Processor Systems (HPS) 6.6. JTAG Interface 6.7. FPGA Configuration 6.8. Development Kit Examples 6.9. Schematic Review Worksheet 6.10. Step-by-Step Generic PCB Design Flow
6.4. Transceivers x
6.4.1. High-Speed Serial Interface Signal Integrity Design Guidelines 6.4.2. Tiles
6.4.2. Tiles x
6.4.2.1. F-Tile Transceivers 6.4.2.2. E-Tile Transceivers 6.4.2.3. P-Tile Transceivers 6.4.2.4. R-Tile Transceivers
6.10. Step-by-Step Generic PCB Design Flow x
6.10.1. Getting Ready 6.10.2. Schematic Design 6.10.3. Board Layout 6.10.4. Checks
7. Signal Integrity Simulations x
7.1. Intel Advanced Link Analyzer 7.2. Signal Integrity Analysis with Third-Party Tools 7.3. IBIS Models 7.4. Transceiver IBIS-AMI Models 7.5. Net Length Reports
8. Validation x
8.1. Validation and Debug Tools 8.2. Boundary-Scan Description Language (BSDL) Models
8.1. Validation and Debug Tools x
8.1.1. Transceiver Toolkit 8.1.2. EMIF Toolkit and Debug Tools 8.1.3. System Console 8.1.4. Signal Tap 8.1.5. Programmer’s Configuration Debugger Tool
8.2. Boundary-Scan Description Language (BSDL) Models x
8.2.1. Pre-Configuration BSDL Files 8.2.2. Post-Configuration BSDL Generator
1. Introduction
2. Product Family Plan
3. Package Information
4. Thermal Design Considerations
5. Pin Connection Guidelines and Pinouts
6. Printed Circuit Board (PCB) Design
7. Signal Integrity Simulations
8. Validation
9. Document Revision History for the Agilex™ 7 FPGAs and SoC FPGAs Package, Pinout, and PCB Design User Guide

6.3. External Memory

The External Memory User Guide for Agilex™ 7 Devices includes information on "DDR" Design Guidelines. The following topics provide guidelines for improving the signal integrity of your system and for successfully implementing external memory interfaces on your system.

  • Comparison of several types of termination schemes, and their effects on the signal quality on the receiver.
  • Proper on-chip termination and signal condition settings on the FPGA to optimize the signal integrity at the receiver.
  • Effects of different loading types, such as components versus DIMM configuration, on signal quality.

Memory Interface support varies by series. F-Series and I-Series support DDR4 and QDR IV interfaces. M-Series supports LPDDR5, DDR5, and DDR4 interfaces. Refer to the following user guides for detailed information.

  • External Memory Interfaces Agilex™ 7 F-Series and I-Series FPGA IP User Guide
  • External Memory Interfaces Agilex™ 7 M-Series FPGA IP User Guide

Refer to the respective EMIF Release Notes for a table on different EMIF performance rates by speed grade and loading (number of dice, ranks, etc.).

  • External Memory Interfaces Agilex™ 7 F-Series and I-Series FPGA IP Core Release Notes
  • External Memory Interfaces Agilex™ 7 M-Series FPGA IP Core Release Notes

The External Memory Interface Pin Information for Agilex™ 7 F-Series and I-Series Devices - XLS Format lists the Package (Pin) Name versus different memory standard schemes in table format.

Similar information for M-Series devices is located in the External Memory Interfaces Agilex™ 7 M-Series FPGA IP User Guide.

An interactive External Memory Interface (EMIF) Spec Estimator is also available on Intel.com. You can enter multiple application specific parameters, and get the resulting interface details.

Agilex™ 7 FPGA Net Length Report are also available which provide the propagation delay from the micro bump on the die to the package ball. These are used to deskew the full interconnect length for optimal signal quality.

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