Embedded Design Handbook

ID 683689
Date 8/28/2023
Public
Document Table of Contents

3.7.10.1. Generate a Testbench System in Platform Designer

The custom pattern generator generates high-speed streaming data for testing memory devices. The soft-programmable custom pattern generator can generate multiple test patterns, and is programmed with the pattern data and pattern length. When the end of the pattern is reached, the custom pattern generator cycles back to the first element of the pattern.

If you do not want to use the Platform Designer-generated testbench system, you can create your own Platform Designer testbench system by adding the Avalon® Verification Suite Bus Functional Models (BFMs) or your own models for simulation. You can also generate a Platform Designer simulation model for the design or Platform Designer system under test, and use your own custom HDL testbench to provide the simulation stimulus.