AN 737: SEU Detection and Recovery in Arria® 10 Devices

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ID 683064
Date 7/08/2024
Public
Document Table of Contents
Document Table of Contents x
1. Overview 2. Quartus® Prime Software SEU FIT Reports 3. Arria® 10 Error Detection and Correction Feature Architecture 4. Guidelines for Error Detection CRC and Error Correction Feature 5. Guidelines for Embedded Memory ECC Feature 6. Arria® 10 EDCRC Reference Design 7. Implementing ECC Feature in Arria® 10 ROM Design 8. Modifying Single-Device .jam Files for Use in a Multi-Device JTAG Chain 9. Document Revision History for AN 737: SEU Detection and Recovery in Arria® 10 Devices
2. Quartus® Prime Software SEU FIT Reports x
2.1. Enabling the Projected SEU FIT by Component Usage Report 2.2. SEU FIT Parameters Report 2.3. Projected SEU FIT by Component Usage Report
2.3. Projected SEU FIT by Component Usage Report x
2.3.1. Component FIT Rates 2.3.2. Raw FIT 2.3.3. Utilized FIT 2.3.4. Mitigated FIT 2.3.5. Architectural Vulnerability Factor
2.3.3. Utilized FIT x
2.3.3.1. Comparing .smh Critical Bits Report to Utilized Bit Count 2.3.3.2. Considerations for Small Designs
3. Arria® 10 Error Detection and Correction Feature Architecture x
3.1. Error Detection and Correction for CRAM 3.2. Memory Blocks Error Correction Code Support
3.1. Error Detection and Correction for CRAM x
3.1.1. Error Detection Cyclic Redundancy Check 3.1.2. Recovering from CRC Errors
3.1.1. Error Detection Cyclic Redundancy Check x
3.1.1.1. Column-Based and Frame-Based Check-Bits 3.1.1.2. Error Message Register
4. Guidelines for Error Detection CRC and Error Correction Feature x
4.1. Error Detection 4.2. Enabling Error Correction (Internal Scrubbing) 4.3. Interpreting CRC_ERROR
4.1. Error Detection x
4.1.1. Enabling Error Detection 4.1.2. Reading EMR
4.1.1. Enabling Error Detection x
4.1.1.1. Enabling the Error Detection CRC_ERROR Pin
4.1.2. Reading EMR x
4.1.2.1. Reading EMR using EMR Unloader IP Core 4.1.2.2. Reading EMR using HPS 4.1.2.3. Reading EMR using JTAG Interface
4.3. Interpreting CRC_ERROR x
4.3.1. CRC_ERROR Pin Behavior 4.3.2. Correctable and Uncorrectable Error
6. Arria® 10 EDCRC Reference Design x
6.1. System Requirements 6.2. Creating Arria® 10 SEU Fault Injection and Hierarchy Tagging Design with Qsys 6.3. Design Testing with Fault Injection Debugger
6.2. Creating Arria® 10 SEU Fault Injection and Hierarchy Tagging Design with Qsys x
6.2.1. Starting Quartus® Prime Software and Opening the Reference Design Project 6.2.2. Creating New Qsys System 6.2.3. Generating Qsys System 6.2.4. Integrating Qsys System into Quartus Prime Project
6.2.2. Creating New Qsys System x
6.2.2.1. Specifying Target FPGA and Clock Settings 6.2.2.2. Adding Altera IOPLL IP Core 6.2.2.3. Adding EMR Unloader IP Core 6.2.2.4. Adding Advance SEU Detection IP Core 6.2.2.5. Adding Fault Injection IP Core 6.2.2.6. Adding Avalon-ST Splitter 6.2.2.7. Adding Serial Flash Controller
6.2.4. Integrating Qsys System into Quartus Prime Project x
6.2.4.1. Generating In-System Source and Probe IP Core 6.2.4.2. Quartus Prime Project Settings 6.2.4.3. Assigning ASD Regions 6.2.4.4. Assigning FPGA Pin Location 6.2.4.5. Compiling the Project
6.3. Design Testing with Fault Injection Debugger x
6.3.1. Converting .sof File and .smh File to .jic File 6.3.2. Programing .jic File into EPCQ-L 6.3.3. Launching Signal Tap Logic Analyzer 6.3.4. Configuring Arria® 10 and Reading .smh File with Fault Injection Debugger 6.3.5. Injecting Error with Fault Injection Debugger
7. Implementing ECC Feature in Arria® 10 ROM Design x
7.1. Examples of Error Detection and Correction
1. Overview
2. Quartus® Prime Software SEU FIT Reports
3. Arria® 10 Error Detection and Correction Feature Architecture
4. Guidelines for Error Detection CRC and Error Correction Feature
5. Guidelines for Embedded Memory ECC Feature
6. Arria® 10 EDCRC Reference Design
7. Implementing ECC Feature in Arria® 10 ROM Design
8. Modifying Single-Device .jam Files for Use in a Multi-Device JTAG Chain
9. Document Revision History for AN 737: SEU Detection and Recovery in Arria® 10 Devices

2.3.3. Utilized FIT

The Utilized column shows FIT calculations considering only resources that the design actually uses. Since SEU events in unused resources do not affect the FPGA, you can safely ignore these bits for resiliency statistics.
Additionally, the Utilized column discounts unused memory bits. For example, implementing a 16 × 16 memory in an M20K block uses only 256 bits of the 20 Kb.
Note: The Error Detection flag and the Projected SEU FIT by Component report do not distinguish between critical bit upsets, such as fundamental control logic, or non critical bit upsets, such as initialization logic that executes only once in the design. Apply hierarchy tags at the system level to filter out less important logic errors.

The Projected SEU FIT by Component report's Utilized CRAM FIT represents provable deflation of the FIT rate to account for CRAM upsets that do not matter to the design. Thus, the SEU incidence is always higher than the utilized FIT rate.


Section Content
Comparing .smh Critical Bits Report to Utilized Bit Count
Considerations for Small Designs

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