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1. Overview
2. Quartus® Prime Software SEU FIT Reports
3. Arria® 10 Error Detection and Correction Feature Architecture
4. Guidelines for Error Detection CRC and Error Correction Feature
5. Guidelines for Embedded Memory ECC Feature
6. Arria® 10 EDCRC Reference Design
7. Implementing ECC Feature in Arria® 10 ROM Design
8. Modifying Single-Device .jam Files for Use in a Multi-Device JTAG Chain
9. Document Revision History for AN 737: SEU Detection and Recovery in Arria® 10 Devices
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2.3.5. Architectural Vulnerability Factor
The Single Event Functional Interrupt (SEFI) ratio measures bit errors due to SEU strikes versus functional interrupts. Minimizing this ratio improves SEU mitigation.
10% SEFI factors are A typical specification to deflate the raw FIT to that observed in practice. For reference, the last two columns in the Projected SEU FIT by Component Usage report show AVF deflations for a conservative SEFI of 50% and a moderate SEFI of 25%.
SEFI represents a combination of factors. A utilization + ECC factor of 40% and AVF of 25% thus represents a global SEFI factor of 10%, because 0.4 × 0.25 = 0.1. An end-to-end SEFI factor of 10% is typical for a full design.
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