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1. Logic Array Blocks and Adaptive Logic Modules in Cyclone® 10 GX Devices
2. Embedded Memory Blocks in Cyclone® 10 GX Devices
3. Variable Precision DSP Blocks in Cyclone® 10 GX Devices
4. Clock Networks and PLLs in Cyclone® 10 GX Devices
5. I/O and High Speed I/O in Cyclone® 10 GX Devices
6. External Memory Interfaces in Cyclone® 10 GX Devices
7. Configuration, Design Security, and Remote System Upgrades in Cyclone® 10 GX Devices
8. SEU Mitigation for Cyclone® 10 GX Devices
9. JTAG Boundary-Scan Testing in Cyclone® 10 GX Devices
10. Power Management in Cyclone® 10 GX Devices
2.1. Types of Embedded Memory
2.2. Embedded Memory Design Guidelines for Cyclone® 10 GX Devices
2.3. Embedded Memory Features
2.4. Embedded Memory Modes
2.5. Embedded Memory Clocking Modes
2.6. Parity Bit in Embedded Memory Blocks
2.7. Byte Enable in Embedded Memory Blocks
2.8. Memory Blocks Packed Mode Support
2.9. Memory Blocks Address Clock Enable Support
2.10. Memory Blocks Asynchronous Clear
2.11. Memory Blocks Error Correction Code Support
2.12. Embedded Memory Blocks in Cyclone® 10 GX Devices Revision History
3.4.1. Input Register Bank
3.4.2. Pipeline Register
3.4.3. Pre-Adder for Fixed-Point Arithmetic
3.4.4. Internal Coefficient for Fixed-Point Arithmetic
3.4.5. Multipliers
3.4.6. Adder
3.4.7. Accumulator and Chainout Adder for Fixed-Point Arithmetic
3.4.8. Systolic Registers for Fixed-Point Arithmetic
3.4.9. Double Accumulation Register for Fixed-Point Arithmetic
3.4.10. Output Register Bank
4.2.1. PLL Usage
4.2.2. PLL Architecture
4.2.3. PLL Control Signals
4.2.4. Clock Feedback Modes
4.2.5. Clock Multiplication and Division
4.2.6. Programmable Phase Shift
4.2.7. Programmable Duty Cycle
4.2.8. PLL Cascading
4.2.9. Reference Clock Sources
4.2.10. Clock Switchover
4.2.11. PLL Reconfiguration and Dynamic Phase Shift
5.1. I/O and Differential I/O Buffers in Cyclone® 10 GX Devices
5.2. I/O Standards and Voltage Levels in Cyclone® 10 GX Devices
5.3. Altera FPGA I/O IP Cores for Cyclone® 10 GX Devices
5.4. I/O Resources in Cyclone® 10 GX Devices
5.5. Architecture and General Features of I/Os in Cyclone® 10 GX Devices
5.6. High Speed Source-Synchronous SERDES and DPA in Cyclone® 10 GX Devices
5.7. Using the I/Os and High Speed I/Os in Cyclone® 10 GX Devices
5.8. I/O and High Speed I/O in Cyclone® 10 GX Devices Revision History
5.6.1. Cyclone® 10 GX LVDS SERDES Usage Modes
5.6.2. SERDES Circuitry
5.6.3. SERDES I/O Standards Support in Cyclone® 10 GX Devices
5.6.4. Differential Transmitter in Cyclone® 10 GX Devices
5.6.5. Differential Receiver in Cyclone® 10 GX Devices
5.6.6. PLLs and Clocking for Cyclone® 10 GX Devices
5.6.7. Timing and Optimization for Cyclone® 10 GX Devices
5.6.6.1. Clocking Differential Transmitters
5.6.6.2. Clocking Differential Receivers
5.6.6.3. Guideline: LVDS Reference Clock Source
5.6.6.4. Guideline: Use PLLs in Integer PLL Mode for LVDS
5.6.6.5. Guideline: Use High-Speed Clock from PLL to Clock LVDS SERDES Only
5.6.6.6. Guideline: Pin Placement for Differential Channels
5.6.6.7. LVDS Interface with External PLL Mode
5.7.1. I/O and High-Speed I/O General Guidelines for Cyclone® 10 GX Devices
5.7.2. Mixing Voltage-Referenced and Non-Voltage-Referenced I/O Standards
5.7.3. Guideline: Maximum Current Driving I/O Pins While Turned Off and During Power Sequencing
5.7.4. Guideline: Maximum DC Current Restrictions
5.7.5. Guideline: LVDS SERDES IP Core Instantiation
5.7.6. Guideline: LVDS SERDES Pin Pairs for Soft-CDR Mode
5.7.7. Guideline: Minimizing High Jitter Impact on Cyclone® 10 GX GPIO Performance
5.7.8. Guideline: Usage of I/O Bank 2A for External Memory Interfaces
6.1. Key Features of the Cyclone® 10 GX External Memory Interface Solution
6.2. Memory Standards Supported by Cyclone® 10 GX Devices
6.3. External Memory Interface Widths in Cyclone® 10 GX Devices
6.4. External Memory Interface I/O Pins in Cyclone® 10 GX Devices
6.5. Memory Interfaces Support in Cyclone® 10 GX Device Packages
6.6. External Memory Interface IP Support in Cyclone® 10 GX Devices
6.7. External Memory Interface Architecture of Cyclone® 10 GX Devices
6.8. External Memory Interfaces in Cyclone® 10 GX Devices Revision History
9.1. BST Operation Control
9.2. I/O Voltage for JTAG Operation
9.3. Performing BST
9.4. Enabling and Disabling IEEE Std. 1149.1 BST Circuitry
9.5. Guidelines for IEEE Std. 1149.1 Boundary-Scan Testing
9.6. IEEE Std. 1149.1 Boundary-Scan Register
9.7. IEEE Std. 1149.6 Boundary-Scan Register
9.8. JTAG Boundary-Scan Testing in Cyclone® 10 GX Devices Revision History
10.1. Power Consumption
10.2. Programmable Power Technology
10.3. Power Sense Line
10.4. Voltage Sensor
10.5. Temperature Sensing Diode
10.6. Power-On Reset Circuitry
10.7. Power Sequencing Considerations for Cyclone® 10 GX Devices
10.8. Power Supply Design
10.9. Power Management in Cyclone® 10 GX Devices Revision History
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10.7. Power Sequencing Considerations for Cyclone® 10 GX Devices
The Cyclone® 10 GX devices require a specific power-up and power-down sequence. This document describes several power management options and discusses proper I/O management during device power-up and power-down. Design your power supply solution to properly control the complete power sequence.
The requirements in this document must be followed to prevent unnecessary current draw to the FPGA device. Cyclone® 10 GX devices do not support 'Hot-Socketing' except under the conditions stated in the table below. The tables below also show what the unpowered pins can tolerate during power-up and power-down sequences.
Power-Up | Power-Down | |||||||
---|---|---|---|---|---|---|---|---|
Pin Type | Tristate | Drive to GND | Drive to VCCIO | Driven with < 1.1 Vp-p | Tristate | Drive to GND | Drive to VCCIO | Driven with < 1.1 Vp-p |
3VIO banks | √ | - | - | - | √ | √ | - | - |
LVDS I/O banks | √ | √ | √35 | - | √ | √ | √35 | - |
Differential Transceiver pins | √ | √ | - | - | √ | √ | - | - |
Section Content
Power-Up Sequence Requirements for Cyclone 10 GX Devices
Power-Down Sequence Recommendations and Requirements for Cyclone 10 GX Devices
Related Information
35 The maximum current allowed through any LVDS I/O bank pin when the device is unpowered or during power up/down conditions = 10 mA (refer to "LVDS I/O Pin Guidance for Unpowered FPGA Pins").