General-Purpose I/O User Guide: Agilex™ 5 FPGAs and SoCs

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ID 813934
Date 4/05/2024
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Document Table of Contents
Document Table of Contents x
1. Agilex™ 5 General-Purpose I/O Overview 2. Agilex™ 5 HSIO Banks 3. Agilex™ 5 HVIO Banks 4. Agilex™ 5 HPS I/O Banks 5. Agilex™ 5 SDM I/O Banks 6. Agilex™ 5 I/O Troubleshooting Guidelines 7. GPIO Intel® FPGA IP 8. Programmable I/O Features Description 9. Document Revision History for the General-Purpose I/O User Guide: Agilex™ 5 FPGAs and SoCs
1. Agilex™ 5 General-Purpose I/O Overview x
1.1. Package Selection and I/O Vertical Migration Support 1.2. Types of I/O Banks
2. Agilex™ 5 HSIO Banks x
2.1. HSIO Bank Overview 2.2. HSIO Features 2.3. HSIO Implementation Guide 2.4. HSIO Termination 2.5. HSIO Design Guidelines 2.6. HSIO Simulation
2.1. HSIO Bank Overview x
2.1.1. HSIO Bank Structure 2.1.2. HSIO Buffers and Registers
2.2. HSIO Features x
2.2.1. Supported I/O Standards for HSIO Banks 2.2.2. HSIO Buffer Behavior 2.2.3. Programmable I/O Element Features for the HSIO Bank
2.2.3. Programmable I/O Element Features for the HSIO Bank x
2.2.3.1. Guidelines: Programmable Output Slew Rate Control 2.2.3.2. Guidelines: Programmable Pull-Up Resistor 2.2.3.3. Guidelines: Programmable De-Emphasis 2.2.3.4. Guidelines: Programmable Receiver Equalization Calibration
2.3. HSIO Implementation Guide x
2.3.1. I/O Assignments with the Quartus® Prime Assignment Editor 2.3.2. Assigning Pin I/O Standards in the Quartus® Prime Pin Planner
2.3.1. I/O Assignments with the Quartus® Prime Assignment Editor x
2.3.1.1. Assigning Pin I/O Standards in the Quartus® Prime Assignment Editor 2.3.1.2. Assigning Programmable IOE Features in the Quartus® Prime Assignment Editor 2.3.1.3. HSIO Programmable IOE Features Assignment Names and Settings
2.4. HSIO Termination x
2.4.1. Single-Ended I/O Termination in Agilex™ 5 Devices 2.4.2. True Differential Signaling I/O Termination in Agilex™ 5 Devices
2.4.1. Single-Ended I/O Termination in Agilex™ 5 Devices x
2.4.1.1. Single-Ended I/O Standards On-Chip Termination 2.4.1.2. OCT Calibration Block 2.4.1.3. Single-Ended I/O Standards External Termination 2.4.1.4. Single-Ended I/O Termination Implementation Guide
2.4.1.1. Single-Ended I/O Standards On-Chip Termination x
2.4.1.1.1. RS OCT 2.4.1.1.2. RT OCT 2.4.1.1.3. Dynamic OCT
2.4.1.4. Single-Ended I/O Termination Implementation Guide x
2.4.1.4.1. Configuring OCT Using the Assignment Editor 2.4.1.4.2. OCT Features Assignment Names and Settings
2.4.2. True Differential Signaling I/O Termination in Agilex™ 5 Devices x
2.4.2.1. True Differential Signaling I/O Standard On-Chip Termination 2.4.2.2. True Differential Signaling I/O Standard External Termination
2.4.2.1. True Differential Signaling I/O Standard On-Chip Termination x
2.4.2.1.1. Configuring Differential Input RD OCT Using the Assignment Editor 2.4.2.1.2. Guidelines: Differential Input RD OCT
2.5. HSIO Design Guidelines x
2.5.1. I/O Standard Placement Restrictions for True Differential I/Os 2.5.2. Placement Restrictions for True Differential and Single-Ended I/O Standards in the Same or Adjacent HSIO Bank 2.5.3. VREF Sources and Input Standards Grouping 2.5.4. HSIO Pin Restrictions for External Memory Interfaces 2.5.5. RZQ Pin Requirement 2.5.6. I/O Standards Implementation Based on VCCIO_PIO Voltages 2.5.7. I/O Standard Selection and I/O Bank Supply Compatibility Check 2.5.8. Simultaneous Switching Noise 2.5.9. HPS Shared I/O Requirements 2.5.10. Clocking Requirements 2.5.11. SDM Shared I/O Requirements 2.5.12. Unused Pins 2.5.13. VCCIO_PIO Supply for Unused HSIO Banks 2.5.14. HSIO Pins During Power Sequencing 2.5.15. Drive Strength Requirement for HSIO Input Pins 2.5.16. Maximum DC Current Restrictions 2.5.17. 1.05 V, 1.1 V, or 1.2 V I/O Interface Voltage Level Compatibility 2.5.18. Connection to True Differential Signaling Input Buffers During Device Reconfiguration 2.5.19. LVSTL700 I/O Standards Differential Pin Pair Requirements 2.5.20. Implementing a Pseudo Open Drain 2.5.21. Allowed Duration for Using RT OCT 2.5.22. Single-Ended Strobe Signal Differential Pin Pair Restriction 2.5.23. Implementing SLVS-400 or DPHY I/O Standard with 1.1 V VCCIO_PIO
2.6. HSIO Simulation x
2.6.1. IBIS Models—HSIO Support 2.6.2. IBIS-AMI Models 2.6.3. HSPICE* Models 2.6.4. Net Length Reports
3. Agilex™ 5 HVIO Banks x
3.1. HVIO Bank Overview 3.2. HVIO Features 3.3. HVIO Implementation Guide 3.4. HVIO Design Guidelines 3.5. HVIO Simulation
3.1. HVIO Bank Overview x
3.1.1. HVIO Bank Structure 3.1.2. HVIO Buffers and Registers
3.2. HVIO Features x
3.2.1. Supported I/O Standards for HVIO Banks 3.2.2. Dedicated Features of HVIO Pins 3.2.3. HVIO Buffer Behavior 3.2.4. Programmable I/O Element Features for the HVIO Bank
3.2.4. Programmable I/O Element Features for the HVIO Bank x
3.2.4.1. Guidelines: Programmable Open-Drain Output
3.3. HVIO Implementation Guide x
3.3.1. I/O Assignments with the Quartus® Prime Assignment Editor
3.3.1. I/O Assignments with the Quartus® Prime Assignment Editor x
3.3.1.1. Assigning Pin I/O Standards in the Quartus® Prime Assignment Editor 3.3.1.2. Assigning Programmable IOE Features in the Quartus® Prime Assignment Editor 3.3.1.3. HVIO Programmable IOE Features Assignment Names and Settings
3.4. HVIO Design Guidelines x
3.4.1. HVIO Pins During Power Sequencing 3.4.2. Unused HVIO Pins 3.4.3. VCCIO_HVIO Supply for Unused HVIO Banks 3.4.4. Maximum DC Current Restrictions
3.5. HVIO Simulation x
3.5.1. IBIS Models—HVIO Support 3.5.2. HSPICE* Models 3.5.3. Net Length Reports
4. Agilex™ 5 HPS I/O Banks x
4.1. HPS I/O Bank Overview 4.2. HPS I/O Features 4.3. HPS I/O Implementation Guide 4.4. HPS I/O Design Guidelines 4.5. HPS I/O Simulation
4.2. HPS I/O Features x
4.2.1. Supported I/O Standards for HPS I/O Banks 4.2.2. Programmable I/O Element Features for the HPS I/O Bank 4.2.3. HPS I/O Buffer Behavior
4.3. HPS I/O Implementation Guide x
4.3.1. Configuring Open Drain Feature for the HPS I/O 4.3.2. I/O Assignments with the Quartus® Prime Assignment Editor 4.3.3. Assigning Pin I/O Standards in the Quartus® Prime Pin Planner
4.3.2. I/O Assignments with the Quartus® Prime Assignment Editor x
4.3.2.1. Assigning Programmable IOE Features in the Quartus® Prime Assignment Editor 4.3.2.2. HPS I/O Programmable IOE Features Assignment Names and Settings
4.4. HPS I/O Design Guidelines x
4.4.1. HPS I/O Pins During Power Sequencing 4.4.2. HPS Shared I/O Requirements
4.5. HPS I/O Simulation x
4.5.1. IBIS Models—HPS I/O Support 4.5.2. Net Length Reports
5. Agilex™ 5 SDM I/O Banks x
5.1. SDM I/O Bank Overview 5.2. SDM I/O Features 5.3. SDM I/O Design Guidelines 5.4. SDM I/O Simulation
5.2. SDM I/O Features x
5.2.1. Supported I/O Standards for SDM I/O Banks 5.2.2. SDM I/O Buffer Behavior 5.2.3. I/O Standards and Features for Configuration Pins
5.3. SDM I/O Design Guidelines x
5.3.1. SDM I/O Pins During Power Sequencing 5.3.2. Avalon® Streaming Interface Dedicated Configuration Pins
5.4. SDM I/O Simulation x
5.4.1. IBIS Models—SDM I/O Support 5.4.2. Net Length Reports
7. GPIO Intel® FPGA IP x
7.1. Release Information for GPIO Intel® FPGA IP 7.2. Generating the GPIO Intel® FPGA IP 7.3. GPIO Intel® FPGA IP Parameter Settings 7.4. GPIO Intel® FPGA IP Interface Signals 7.5. GPIO Intel® FPGA IP Architecture 7.6. Verifying Resource Utilization and Design Performance 7.7. GPIO Intel® FPGA IP Timing 7.8. GPIO Intel® FPGA IP Design Examples
7.2. Generating the GPIO Intel® FPGA IP x
7.2.1. Intel® FPGA IP Generation Output
7.3. GPIO Intel® FPGA IP Parameter Settings x
7.3.1. Guideline: Swap datain_h and datain_l Ports in Migrated IP
7.4. GPIO Intel® FPGA IP Interface Signals x
7.4.1. Shared Signals 7.4.2. Data Bit-Order for Data Interface 7.4.3. Input and Output Bus High and Low Bits 7.4.4. Data Interface Signals and Corresponding Clocks
7.5. GPIO Intel® FPGA IP Architecture x
7.5.1. GPIO Intel® FPGA IP Data Paths 7.5.2. Register Packing
7.5.1. GPIO Intel® FPGA IP Data Paths x
7.5.1.1. Input Path 7.5.1.2. Output and Output Enable Paths
7.7. GPIO Intel® FPGA IP Timing x
7.7.1. Timing Components 7.7.2. Delay Elements 7.7.3. Timing Analysis 7.7.4. Timing Closure Guidelines
7.7.3. Timing Analysis x
7.7.3.1. Single Data Rate Input Register 7.7.3.2. DDIO Input Register 7.7.3.3. Single Data Rate Output Register 7.7.3.4. DDIO Output Register
7.8. GPIO Intel® FPGA IP Design Examples x
7.8.1. GPIO Intel® FPGA IP Synthesizable Quartus® Prime Design Example 7.8.2. GPIO Intel® FPGA IP Simulation Design Example
8. Programmable I/O Features Description x
8.1. Programmable Pre-Emphasis 8.2. Programmable De-Emphasis 8.3. Programmable Differential Output Voltage 8.4. Continuous Time Linear Equalization 8.5. Decision Feedback Equalization
1. Agilex™ 5 General-Purpose I/O Overview
2. Agilex™ 5 HSIO Banks
3. Agilex™ 5 HVIO Banks
4. Agilex™ 5 HPS I/O Banks
5. Agilex™ 5 SDM I/O Banks
6. Agilex™ 5 I/O Troubleshooting Guidelines
7. GPIO Intel® FPGA IP
8. Programmable I/O Features Description
9. Document Revision History for the General-Purpose I/O User Guide: Agilex™ 5 FPGAs and SoCs

2.4.1.1.2. RT OCT

The Agilex™ 5 devices support RT OCT with and without calibration. RT OCT is available only for input and bidirectional pins. Output pins do not support RT OCT.

You must disable RT OCT for interfaces that require external termination circuitry near the receiver of the Agilex™ 5 device.

Table 13.  RT OCT Schemes
OCT Scheme Description
RT OCT without calibration
  • Available only on the input buffer.
  • Receiver impedance matching provides the receiver with a controlled input impedance that closely matches the impedance of the transmission line.
RT OCT with calibration
  • The RT OCT calibration circuit uses the impedance of the external resistor connected to the RZQ pin as a reference.
  • During calibration, the circuit continuously alters the impedance of the I/O buffer until the value reaches the target impedance, which is a predetermined ratio to the reference resistance.
  • The calibration occurs at the end of the device configuration. When the calibration circuit finds the correct impedance, the circuit stops changing the characteristics of the drivers.
  • In EMIF and MIPI* D-PHY* modes, you may trigger recalibration during user mode.
Figure 11. RT OCT with Calibration
Table 14.  Selectable I/O Standards for RT OCT with CalibrationThis table lists the output termination settings for calibrated OCT on different I/O standards. The default values are in bold font.
I/O Standard RT OCT without Calibration7 (Ω) RT OCT with Calibration (Ω)
1.3 V LVCMOS — —
1.2 V LVCMOS — —
1.1 V LVCMOS — —
1.05 V LVCMOS — —
1.0 V LVCMOS — —
SSTL-12 50 50, 60
HSTL-12 50 50, 60
HSUL-12 — —
POD12 50 40, 50, 60
POD11 50 40, 50, 60
LVSTL11 50 40, 50, 60
LVSTL105 50 40, 50, 60
LVSTL700 — 40, 50, 60
Differential SSTL-12 50 50, 60
Differential HSTL-12 50 50, 60
Differential HSUL-12 — —
Differential POD12 50 40, 50, 60
Differential POD11 50 40, 50, 60
Differential LVSTL11 50 40, 50, 60
Differential LVSTL105 50 40, 50, 60
Differential LVSTL700 — 40, 50, 60
Related Information
7 Supported only in GPIO mode.
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