Visible to Intel only — GUID: mcn1419933301836
Ixiasoft
1.1.1.4.1. Supply Current and Power Consumption
1.1.1.4.2. I/O Pin Leakage Current
1.1.1.4.3. Bus Hold Specifications
1.1.1.4.4. OCT Calibration Accuracy Specifications
1.1.1.4.5. OCT Without Calibration Resistance Tolerance Specifications
1.1.1.4.6. OCT Variation after Power-Up Calibration
1.1.1.4.7. Pin Capacitance
1.1.1.4.8. Hot Socketing
1.1.1.4.9. Internal Weak Pull-Up Resistor
1.1.1.5.1. Single-Ended I/O Standards
1.1.1.5.2. Single-Ended SSTL, HSTL, and HSUL I/O Reference Voltage Specifications
1.1.1.5.3. Single-Ended SSTL, HSTL, and HSUL I/O Standards Signal Specifications
1.1.1.5.4. Differential SSTL I/O Standards
1.1.1.5.5. Differential HSTL and HSUL I/O Standards
1.1.1.5.6. Differential I/O Standard Specifications
1.2.1.1. Transceiver Specifications for Arria V GX and SX Devices
1.2.1.2. Transceiver Specifications for Arria V GT and ST Devices
1.2.1.3. CTLE Response at Data Rates > 3.25 Gbps across Supported AC Gain and DC Gain
1.2.1.4. CTLE Response at Data Rates ≤ 3.25 Gbps across Supported AC Gain and DC Gain
1.2.1.5. Typical TX VOD Setting for Arria® V Transceiver Channels with termination of 100 Ω
1.2.1.6. Transmitter Pre-Emphasis Levels
1.2.1.7. Transceiver Compliance Specification
1.2.3.1. High-Speed I/O Specifications
1.2.3.2. DPA Lock Time Specifications
1.2.3.3. LVDS Soft-CDR/DPA Sinusoidal Jitter Tolerance Specifications
1.2.3.4. DLL Frequency Range Specifications
1.2.3.5. DQS Logic Block Specifications
1.2.3.6. Memory Output Clock Jitter Specifications
1.2.3.7. OCT Calibration Block Specifications
1.2.3.8. Duty Cycle Distortion (DCD) Specifications
1.2.4.1. HPS Clock Performance
1.2.4.2. HPS PLL Specifications
1.2.4.3. Quad SPI Flash Timing Characteristics
1.2.4.4. SPI Timing Characteristics
1.2.4.5. SD/MMC Timing Characteristics
1.2.4.6. USB Timing Characteristics
1.2.4.7. Ethernet Media Access Controller (EMAC) Timing Characteristics
1.2.4.8. I2C Timing Characteristics
1.2.4.9. NAND Timing Characteristics
1.2.4.10. Arm* Trace Timing Characteristics
1.2.4.11. UART Interface
1.2.4.12. GPIO Interface
1.2.4.13. HPS JTAG Timing Specifications
1.3.1. POR Specifications
1.3.2. FPGA JTAG Configuration Timing
1.3.3. FPP Configuration Timing
1.3.4. Active Serial (AS) Configuration Timing
1.3.5. DCLK Frequency Specification in the AS Configuration Scheme
1.3.6. Passive Serial (PS) Configuration Timing
1.3.7. Initialization
1.3.8. Configuration Files
1.3.9. Minimum Configuration Time Estimation
1.3.10. Remote System Upgrades
1.3.11. User Watchdog Internal Oscillator Frequency Specifications
2.2.3.1.1. High-Speed Clock Specifications
2.2.3.1.2. Transmitter High-Speed I/O Specifications
2.2.3.1.3. Receiver High-Speed I/O Specifications
2.2.3.1.4. DPA Mode High-Speed I/O Specifications
2.2.3.1.5. Soft CDR Mode High-Speed I/O Specifications
2.2.3.1.6. Non DPA Mode High-Speed I/O Specifications
2.3.1. POR Specifications
2.3.2. JTAG Configuration Specifications
2.3.3. Fast Passive Parallel (FPP) Configuration Timing
2.3.4. Active Serial Configuration Timing
2.3.5. Passive Serial Configuration Timing
2.3.6. Initialization
2.3.7. Configuration Files
2.3.8. Remote System Upgrades Circuitry Timing Specification
2.3.9. User Watchdog Internal Oscillator Frequency Specification
Visible to Intel only — GUID: mcn1419933301836
Ixiasoft
1.1.1.4.5. OCT Without Calibration Resistance Tolerance Specifications
Symbol | Description | Condition (V) | Resistance Tolerance | Unit | ||
---|---|---|---|---|---|---|
–I3, –C4 | –I5, –C5 | –C6 | ||||
25-Ω RS | Internal series termination without calibration (25-Ω setting) | VCCIO = 3.0, 2.5 | ±30 | ±40 | ±40 | % |
25-Ω RS | Internal series termination without calibration (25-Ω setting) | VCCIO = 1.8, 1.5 | ±30 | ±40 | ±40 | % |
25-Ω RS | Internal series termination without calibration (25-Ω setting) | VCCIO = 1.2 | ±35 | ±50 | ±50 | % |
50-Ω RS | Internal series termination without calibration (50-Ω setting) | VCCIO = 3.0, 2.5 | ±30 | ±40 | ±40 | % |
50-Ω RS | Internal series termination without calibration (50-Ω setting) | VCCIO = 1.8, 1.5 | ±30 | ±40 | ±40 | % |
50-Ω RS | Internal series termination without calibration (50-Ω setting) | VCCIO = 1.2 | ±35 | ±50 | ±50 | % |
100-Ω RD | Internal differential termination (100-Ω setting) | VCCIO = 2.5 | ±25 | ±40 | ±40 | % |
Figure 2. Equation for OCT Variation Without Recalibration
The definitions for the equation are as follows:
- The ROCT value calculated shows the range of OCT resistance with the variation of temperature and VCCIO.
- RSCAL is the OCT resistance value at power-up.
- ΔT is the variation of temperature with respect to the temperature at power up.
- ΔV is the variation of voltage with respect to the VCCIO at power up.
- dR/dT is the percentage change of RSCAL with temperature.
- dR/dV is the percentage change of RSCAL with voltage.