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1. Intel® Agilex™ General-Purpose I/O and LVDS SERDES Overview
2. Intel® Agilex™ I/O Features and Usage
3. Intel® Agilex™ I/O Termination
4. Intel® Agilex™ High-Speed SERDES I/O Architecture
5. I/O and LVDS SERDES Design Guidelines
6. Troubleshooting Guidelines
7. Documentation Related to the Intel® Agilex™ General-Purpose I/O and LVDS SERDES User Guide
8. Intel® Agilex™ General-Purpose I/O and LVDS SERDES User Guide Archives
9. Document Revision History for the Intel® Agilex™ General-Purpose I/O and LVDS SERDES User Guide
2.2.1. Programmable Output Slew Rate Control
2.2.2. Programmable IOE Delay
2.2.3. Programmable Open-Drain Output
2.2.4. Programmable Bus-Hold
2.2.5. Programmable Pull-Up Resistor
2.2.6. Programmable Pre-emphasis
2.2.7. Programmable De-emphasis
2.2.8. Programmable Differential Output Voltage
2.2.9. Schmitt Trigger Input Buffer
4.1. Intel® Agilex™ High-Speed SERDES I/O Overview
4.2. Using LVDS SERDES Intel FPGA IP for High-Speed LVDS I/O Implementation
4.3. Intel® Agilex™ LVDS SERDES Transmitter
4.4. Intel® Agilex™ LVDS SERDES Receiver
4.5. Intel® Agilex™ LVDS Interface with External PLL Mode
4.6. LVDS SERDES IP Initialization and Reset
4.7. Intel® Agilex™ LVDS SERDES Source-Synchronous Timing Budget
4.8. LVDS SERDES IP Timing
4.9. LVDS SERDES IP Design Examples
5.1.1. VREF Sources and VREF Pins
5.1.2. I/O Standards Implementation based on VCCIO_PIO Voltages
5.1.3. OCT Calibration Block Requirement
5.1.4. Placement Requirements
5.1.5. Simultaneous Switching Noise (SSN)
5.1.6. Special Pins Requirement
5.1.7. External Memory Interface Pin Placement Requirements
5.1.8. HPS Shared I/O Requirements
5.1.9. Clocking Requirements
5.1.10. SDM Shared I/O Requirements
5.1.11. Configuration Pins
5.1.12. Unused Pins
5.1.13. Voltage Setting for Unused I/O Banks
5.1.14. Guidelines for I/O Pins in GPIO, HPS, and SDM Banks During Power Sequencing
5.1.15. Drive Strength Requirement for GPIO Input Pins
5.1.16. Maximum DC Current Restrictions
5.1.17. 1.2 V I/O Interface Voltage Level Compatibility
5.1.18. GPIO Pins for Avalon-ST Configuration Scheme
5.1.19. Maximum True Differential Signaling RX Pairs Per I/O Lane
5.1.20. I/O Simulation
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4.6.3. Resetting the DPA
If data corruption occurs, reset the DPA circuitry.
- Assert the rx_dpa_reset signal to reset the entire DPA block. After you reset the entire DPA block, the DPA must be retrained before capturing data.
You can also fix data corruption by resetting only the synchronization FIFO without resetting the DPA circuit, which means that system operation continues without having to retrain the DPA. To reset just the synchronization FIFO, assert the rx_fifo_reset signal.
- After rx_dpa_locked asserts, the LVDS SERDES IP is ready to capture data. The DPA finds the optimal sample location to capture each bit.
Intel recommends that you toggle the rx_fifo_reset signal after rx_dpa_locked asserts. Toggling rx_fifo_reset ensures that the synchronization FIFO is set with the optimal timing to transfer data between the DPA and the high-speed LVDS clock domains.
- Using custom logic to control the rx_bitslip_ctrl signal on a channel-by-channel basis, set up the word boundary.
You can reset the bit slip circuit at any time, independent of the PLL or DPA circuit operation. To reset the bit slip circuit, use the rx_bitslip_reset signal.