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1. Intel® Agilex™ General-Purpose I/O and LVDS SERDES Overview
2. Intel® Agilex™ I/O Features and Usage
3. Intel® Agilex™ I/O Termination
4. Intel® Agilex™ High-Speed SERDES I/O Architecture
5. I/O and LVDS SERDES Design Guidelines
6. Troubleshooting Guidelines
7. Documentation Related to the Intel® Agilex™ General-Purpose I/O and LVDS SERDES User Guide
8. Intel® Agilex™ General-Purpose I/O and LVDS SERDES User Guide Archives
9. Document Revision History for the Intel® Agilex™ General-Purpose I/O and LVDS SERDES User Guide
2.2.1. Programmable Output Slew Rate Control
2.2.2. Programmable IOE Delay
2.2.3. Programmable Open-Drain Output
2.2.4. Programmable Bus-Hold
2.2.5. Programmable Pull-Up Resistor
2.2.6. Programmable Pre-emphasis
2.2.7. Programmable De-emphasis
2.2.8. Programmable Differential Output Voltage
2.2.9. Schmitt Trigger Input Buffer
4.1. Intel® Agilex™ High-Speed SERDES I/O Overview
4.2. Using LVDS SERDES Intel FPGA IP for High-Speed LVDS I/O Implementation
4.3. Intel® Agilex™ LVDS SERDES Transmitter
4.4. Intel® Agilex™ LVDS SERDES Receiver
4.5. Intel® Agilex™ LVDS Interface with External PLL Mode
4.6. LVDS SERDES IP Initialization and Reset
4.7. Intel® Agilex™ LVDS SERDES Source-Synchronous Timing Budget
4.8. LVDS SERDES IP Timing
4.9. LVDS SERDES IP Design Examples
5.1.1. VREF Sources and VREF Pins
5.1.2. I/O Standards Implementation based on VCCIO_PIO Voltages
5.1.3. OCT Calibration Block Requirement
5.1.4. Placement Requirements
5.1.5. Simultaneous Switching Noise (SSN)
5.1.6. Special Pins Requirement
5.1.7. External Memory Interface Pin Placement Requirements
5.1.8. HPS Shared I/O Requirements
5.1.9. Clocking Requirements
5.1.10. SDM Shared I/O Requirements
5.1.11. Configuration Pins
5.1.12. Unused Pins
5.1.13. Voltage Setting for Unused I/O Banks
5.1.14. Guidelines for I/O Pins in GPIO, HPS, and SDM Banks During Power Sequencing
5.1.15. Drive Strength Requirement for GPIO Input Pins
5.1.16. Maximum DC Current Restrictions
5.1.17. 1.2 V I/O Interface Voltage Level Compatibility
5.1.18. GPIO Pins for Avalon-ST Configuration Scheme
5.1.19. Maximum True Differential Signaling RX Pairs Per I/O Lane
5.1.20. I/O Simulation
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3.1.1.3. Dynamic OCT
Dynamic OCT is useful for terminating a high-performance bidirectional path by optimizing signal integrity depending on the direction of the data. Dynamic OCT also helps save power because termination switches on only during input operation and thus draws less static power.
Dynamic OCT | Bidirectional I/O | State |
---|---|---|
Dynamic RT OCT | Acts as a receiver | Enabled |
Acts as a driver | Disabled | |
Dynamic RS OCT | Acts as a receiver | Disabled |
Acts as a driver | Enabled |
Figure 34. Dynamic RT OCT in Intel® Agilex™ Devices
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