F-Tile JESD204B Intel® FPGA IP Design Example User Guide

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ID 729497
Date 7/15/2022
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Document Table of Contents
Document Table of Contents x
1. About the F-Tile JESD204B Intel® Agilex™ FPGA IP Design Example User Guide 2. F-Tile JESD204B Intel® FPGA IP Design Example Quick Start Guide 3. Detailed Description for the F-Tile JESD204B Design Example 4. Document Revision History for the F-Tile JESD204B Intel® FPGA IP Design Example User Guide
2. F-Tile JESD204B Intel® FPGA IP Design Example Quick Start Guide x
2.1. Design Example Block Diagram 2.2. Software Requirements 2.3. Generating the Design 2.4. Simulating the Design Example Testbench 2.5. Compiling the Design Example 2.6. Compiling and Testing the Design
2.3. Generating the Design x
2.3.1. Design Example Parameters 2.3.2. Directory Structure
2.4. Simulating the Design Example Testbench x
2.4.1. Simulation Testbench
3. Detailed Description for the F-Tile JESD204B Design Example x
3.1. Supported Configurations 3.2. System Components 3.3. Design Example Clock and Reset 3.4. Design Example Signals 3.5. F-Tile JESD204B Design Example Status and Control Registers 3.6. Hardware Test for System Console Control Design Example
3.2. System Components x
3.2.1. JESD204B Subsystem in Platform Designer 3.2.2. Parallel I/O Core 3.2.3. Core PLL 3.2.4. SPI Master 3.2.5. Transport Layer 3.2.6. Test Pattern Generator 3.2.7. Test Pattern Checker
3.6. Hardware Test for System Console Control Design Example x
3.6.1. Board Connectivity
1. About the F-Tile JESD204B Intel® Agilex™ FPGA IP Design Example User Guide
2. F-Tile JESD204B Intel® FPGA IP Design Example Quick Start Guide
3. Detailed Description for the F-Tile JESD204B Design Example
4. Document Revision History for the F-Tile JESD204B Intel® FPGA IP Design Example User Guide

3.2.6. Test Pattern Generator

Note: This module is only available in the design example when the duplex or simplex TX data path option is selected.

The test pattern generator generates either a parallel PRBS, alternate checkerboard, or ramp wave, and sends it to the transport layer during test mode. The test pattern generator is implemented in the top level RTL file, not in the Platform Designer project.

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