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Definitions
Understanding SSN
Guidelines: Clock and Asynchronous Control Input Signal
Guidelines: Data Input Pin
Guidelines: Clock and Data Input Signal for Intel® MAX® 10 E144 Package
Guidelines: I/O Restriction Rules
Guidelines: Placement Restrictions for 1.0 V I/O Pin
Guidelines: Analog-to-Digital Converter I/O Restriction
Guidelines: Voltage-Referenced I/O Standards Restriction
Guidelines: Adhere to the LVDS I/O Restrictions Rules
Guidelines: Enable Clamp Diode for LVTTL/LVCMOS Input Buffers
Guidelines: External Memory Interface I/O Restrictions
Guidelines: ADC Ground Plane Connection
Guidelines: Board Design for ADC Reference Voltage Pin
Guidelines: Board Design for Analog Input
Guidelines: Board Design for Power Supply Pin and ADC Ground (REFGND)
Guidelines: Intel® MAX® 10 Board Design Requirement for DDR2, DDR3, and LPDDR2
Document Revision History for Intel® MAX® 10 FPGA Signal Integrity Design Guidelines
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Guidelines: Data Input Pin
For data input signals, fast edge rates cause simultaneously switching input (SSI) noise problem on the wide data bus.
The noise margin is measured at the VIH or VIL instead of the signal edges.
Percentage of Simultaneous Switching Pins in I/O Bank | Recommended Maximum Data Input Signal Edge Rate |
---|---|
50% to 100% | 0.6 V/ns |
25% to 49% | 1.0 V/ns |
0% to 24% | 1.5 V/ns |
Note: If an input pin has an adjacent pin that operates as a toggling output, the edge rate of the input signal to the input pin must be 1.5 V/ns or faster.
If the data input signal exceeds the recommended signal edge rate, you can apply similar approach as the clock input signal to improve the signal integrity.
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