Agilex™ 7 SEU Mitigation User Guide

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ID 683128
Date 9/20/2024
Public
Document Table of Contents
Document Table of Contents x
1. Agilex™ 7 SEU Mitigation Overview 2. Agilex™ 7 CRAM Error Mitigation 3. Secure Device Manager ECC and SmartVID Errors Detection 4. Agilex™ 7 SEU Mitigation Implementation Guides 5. IP and Software References 6. Agilex™ 7 SEU Mitigation User Guide Archives 7. Document Revision History for the Agilex™ 7 SEU Mitigation User Guide
1. Agilex™ 7 SEU Mitigation Overview x
1.1. SEU Mitigation Techniques 1.2. Configuration RAM 1.3. Memory Blocks 1.4. Secure Device Manager ECC and SmartVID 1.5. Triple Modular Redundancy 1.6. Failure Rates
2. Agilex™ 7 CRAM Error Mitigation x
2.1. CRAM Error Detection and Correction 2.2. Error Message Queue 2.3. Scrubbing 2.4. SEU Sensitivity Processing 2.5. Design Hierarchy Sensitivity Classification 2.6. Evaluation of System Response to Upsets
2.3. Scrubbing x
2.3.1. Internal Scrubbing 2.3.2. Priority Scrubbing
2.4. SEU Sensitivity Processing x
2.4.1. Advanced SEU Detection Intel® FPGA IP
2.4.1. Advanced SEU Detection Intel® FPGA IP x
2.4.1.1. Release Information for Advanced SEU Detection Intel® FPGA IP 2.4.1.2. On-Chip Lookup Sensitivity Processing 2.4.1.3. Off-Chip Lookup Sensitivity Processing 2.4.1.4. Sensitivity Map Header Lookup
2.5. Design Hierarchy Sensitivity Classification x
2.5.1. Hierarchy Tagging
2.6. Evaluation of System Response to Upsets x
2.6.1. Fault Injection Debugger
3. Secure Device Manager ECC and SmartVID Errors Detection x
3.1. SDM ECC Error Message Bits 3.2. SmartVID Error Message Bits 3.3. SDM ECC and SmartVID Errors Signals Behavior
4. Agilex™ 7 SEU Mitigation Implementation Guides x
4.1. Setting the SEU_ERROR Pin 4.2. Setting Up the SEU Mitigation Features 4.3. Enabling Priority Scrubbing 4.4. Assigning Regions for Hierarchy Tagging 4.5. Sensitivity Map Header 4.6. Using the Fault Injection Debugger
4.5. Sensitivity Map Header x
4.5.1. Programming the .smh File into Memory 4.5.2. Looking up the Sensitivity Map Header
4.5.2. Looking up the Sensitivity Map Header x
4.5.2.1. Sensitivity Map Header Revision 4 File Format Reference
4.6. Using the Fault Injection Debugger x
4.6.1. Launching and Setting Up the Fault Injection Debugger 4.6.2. Configuring Your Device using a Software Object File (.sof) 4.6.3. Constraining Regions for Fault Injection 4.6.4. Injecting Errors to Random Locations 4.6.5. Injecting Errors to Specific Locations 4.6.6. Injecting Double Adjacent Errors 4.6.7. Injecting SDM ECC Errors 4.6.8. Analyzing SEU or SDM ECC Errors Using Signal Tap
4.6.6. Injecting Double Adjacent Errors x
4.6.6.1. Injecting Double Adjacent Errors: Command-Line Interface 4.6.6.2. Injecting Double Adjacent Errors: GUI with Tcl Console
4.6.7. Injecting SDM ECC Errors x
4.6.7.1. Injecting SDM ECC Errors: Command-Line Interface 4.6.7.2. Injecting SDM ECC Errors: GUI
5. IP and Software References x
5.1. Advanced SEU Detection Intel® FPGA IP References 5.2. Fault Injection Debugger Software References
5.1. Advanced SEU Detection Intel® FPGA IP References x
5.1.1. Advanced SEU Detection Intel® FPGA IP Parameter Settings 5.1.2. Advanced SEU Detection Intel® FPGA IP Ports
5.2. Fault Injection Debugger Software References x
5.2.1. Fault Injection Debugger GUI Tool 5.2.2. Fault Injection Debugger Command-Line Interface
1. Agilex™ 7 SEU Mitigation Overview
2. Agilex™ 7 CRAM Error Mitigation
3. Secure Device Manager ECC and SmartVID Errors Detection
4. Agilex™ 7 SEU Mitigation Implementation Guides
5. IP and Software References
6. Agilex™ 7 SEU Mitigation User Guide Archives
7. Document Revision History for the Agilex™ 7 SEU Mitigation User Guide

1.3. Memory Blocks

Agilex™ 7 devices contain three types of memory blocks: Embedded SRAM (eSRAM) blocks, M20K blocks, and memory logic array blocks (MLABs).

The eSRAM blocks are only available in selected Agilex™ 7 devices. Refer to the Agilex™ 7 FPGA and SoCs Device Overview to determine which devices contain eSRAM blocks. The M20K blocks and eSRAM blocks support ECC. The ECC feature detects and corrects data errors at the output of the memory.

Note: When you engage the ECC feature, you cannot use the byte enable and coherent read features.
Table 2.  ECC for M20K and eSRAM Blocks
Item M20K Block eSRAM Block
Built-in support In ×32-wide simple dual-port mode In ×64-wide simple dual-port mode.
Features

32-bit word error detection and correction:

  • Single-error correction
  • Double-adjacent-error correction
  • Triple-adjacent-error correction

The ECC cannot guarantee detection or correction of non-adjacent two-bit (or more) errors.

64-bit word error detection or correction:

  • Single-error correction
  • Double-error detection
Flags indicating memory status
  • e—error
  • ue—uncorrectable error

The status flags are part of the regular outputs from the memory block.
  • c{7:0}_error_correct_0—error corrected
  • c{7:0}_error_detect_0—error detected

When you engage ECC, the M20K memory runs slower than in non-ECC simple dual-port mode. To achieve a higher performance—compared to non-pipeline ECC mode—at the expense of a one-cycle latency, enable the optional ECC pipeline registers before the output decoder.

Related Information
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