Agilex™ 7 SEU Mitigation User Guide

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ID 683128
Date 9/20/2024
Public
Document Table of Contents
Document Table of Contents x
1. Agilex™ 7 SEU Mitigation Overview 2. Agilex™ 7 CRAM Error Mitigation 3. Secure Device Manager ECC and SmartVID Errors Detection 4. Agilex™ 7 SEU Mitigation Implementation Guides 5. IP and Software References 6. Agilex™ 7 SEU Mitigation User Guide Archives 7. Document Revision History for the Agilex™ 7 SEU Mitigation User Guide
1. Agilex™ 7 SEU Mitigation Overview x
1.1. SEU Mitigation Techniques 1.2. Configuration RAM 1.3. Memory Blocks 1.4. Secure Device Manager ECC and SmartVID 1.5. Triple Modular Redundancy 1.6. Failure Rates
2. Agilex™ 7 CRAM Error Mitigation x
2.1. CRAM Error Detection and Correction 2.2. Error Message Queue 2.3. Scrubbing 2.4. SEU Sensitivity Processing 2.5. Design Hierarchy Sensitivity Classification 2.6. Evaluation of System Response to Upsets
2.3. Scrubbing x
2.3.1. Internal Scrubbing 2.3.2. Priority Scrubbing
2.4. SEU Sensitivity Processing x
2.4.1. Advanced SEU Detection Intel® FPGA IP
2.4.1. Advanced SEU Detection Intel® FPGA IP x
2.4.1.1. Release Information for Advanced SEU Detection Intel® FPGA IP 2.4.1.2. On-Chip Lookup Sensitivity Processing 2.4.1.3. Off-Chip Lookup Sensitivity Processing 2.4.1.4. Sensitivity Map Header Lookup
2.5. Design Hierarchy Sensitivity Classification x
2.5.1. Hierarchy Tagging
2.6. Evaluation of System Response to Upsets x
2.6.1. Fault Injection Debugger
3. Secure Device Manager ECC and SmartVID Errors Detection x
3.1. SDM ECC Error Message Bits 3.2. SmartVID Error Message Bits 3.3. SDM ECC and SmartVID Errors Signals Behavior
4. Agilex™ 7 SEU Mitigation Implementation Guides x
4.1. Setting the SEU_ERROR Pin 4.2. Setting Up the SEU Mitigation Features 4.3. Enabling Priority Scrubbing 4.4. Assigning Regions for Hierarchy Tagging 4.5. Sensitivity Map Header 4.6. Using the Fault Injection Debugger
4.5. Sensitivity Map Header x
4.5.1. Programming the .smh File into Memory 4.5.2. Looking up the Sensitivity Map Header
4.5.2. Looking up the Sensitivity Map Header x
4.5.2.1. Sensitivity Map Header Revision 4 File Format Reference
4.6. Using the Fault Injection Debugger x
4.6.1. Launching and Setting Up the Fault Injection Debugger 4.6.2. Configuring Your Device using a Software Object File (.sof) 4.6.3. Constraining Regions for Fault Injection 4.6.4. Injecting Errors to Random Locations 4.6.5. Injecting Errors to Specific Locations 4.6.6. Injecting Double Adjacent Errors 4.6.7. Injecting SDM ECC Errors 4.6.8. Analyzing SEU or SDM ECC Errors Using Signal Tap
4.6.6. Injecting Double Adjacent Errors x
4.6.6.1. Injecting Double Adjacent Errors: Command-Line Interface 4.6.6.2. Injecting Double Adjacent Errors: GUI with Tcl Console
4.6.7. Injecting SDM ECC Errors x
4.6.7.1. Injecting SDM ECC Errors: Command-Line Interface 4.6.7.2. Injecting SDM ECC Errors: GUI
5. IP and Software References x
5.1. Advanced SEU Detection Intel® FPGA IP References 5.2. Fault Injection Debugger Software References
5.1. Advanced SEU Detection Intel® FPGA IP References x
5.1.1. Advanced SEU Detection Intel® FPGA IP Parameter Settings 5.1.2. Advanced SEU Detection Intel® FPGA IP Ports
5.2. Fault Injection Debugger Software References x
5.2.1. Fault Injection Debugger GUI Tool 5.2.2. Fault Injection Debugger Command-Line Interface
1. Agilex™ 7 SEU Mitigation Overview
2. Agilex™ 7 CRAM Error Mitigation
3. Secure Device Manager ECC and SmartVID Errors Detection
4. Agilex™ 7 SEU Mitigation Implementation Guides
5. IP and Software References
6. Agilex™ 7 SEU Mitigation User Guide Archives
7. Document Revision History for the Agilex™ 7 SEU Mitigation User Guide

1.6. Failure Rates

The soft error rate (SER) or SEU reliability is expressed in Failures In Time (FIT)—the number of failures you can expect in one billion operation hours.

For example, a design with 5,000 FIT experiences a mean of 5,000 SEU events in 109 hours (114,155.25 years). Because SEU events are statistically independent, FIT is additive. If a single FPGA has 5,000 FIT, then ten FPGAs have 50,000 FIT (50,000 failures in 114,155.25 years).

Another reliability measurement is the mean time to failure (MTTF), which is the reciprocal of the FIT or 1/FIT. For a FIT of 5,000 in standard units of failures per billion hours, MTTF is 1/(5,000/1Bh) = 1 billion/5,000 = 200,000 hours = 22.83 years.

SEU events follow a Poisson distribution, and the cumulative distribution function (CDF) for mean time between failures (MTBF) is an exponential distribution. For more information about failure rate calculation, refer to the Intel® FPGA Reliability Report (available upon request).

Neutron SEU incidence varies by altitude, latitude, and other environmental factors. The Quartus® Prime software provides SEU FIT reports based on compiles for sea level in Manhattan, New York. The JESD89A specification defines the test parameters.

Tip: You can convert the data to other locations and altitudes using calculators. You can adjust the SEU rates in your project by including the relative neutron flux in your project's .qsf file.
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