Agilex™ 7 SEU Mitigation User Guide

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ID 683128
Date 9/20/2024
Public
Document Table of Contents
Document Table of Contents x
1. Agilex™ 7 SEU Mitigation Overview 2. Agilex™ 7 CRAM Error Mitigation 3. Secure Device Manager ECC and SmartVID Errors Detection 4. Agilex™ 7 SEU Mitigation Implementation Guides 5. IP and Software References 6. Agilex™ 7 SEU Mitigation User Guide Archives 7. Document Revision History for the Agilex™ 7 SEU Mitigation User Guide
1. Agilex™ 7 SEU Mitigation Overview x
1.1. SEU Mitigation Techniques 1.2. Configuration RAM 1.3. Memory Blocks 1.4. Secure Device Manager ECC and SmartVID 1.5. Triple Modular Redundancy 1.6. Failure Rates
2. Agilex™ 7 CRAM Error Mitigation x
2.1. CRAM Error Detection and Correction 2.2. Error Message Queue 2.3. Scrubbing 2.4. SEU Sensitivity Processing 2.5. Design Hierarchy Sensitivity Classification 2.6. Evaluation of System Response to Upsets
2.3. Scrubbing x
2.3.1. Internal Scrubbing 2.3.2. Priority Scrubbing
2.4. SEU Sensitivity Processing x
2.4.1. Advanced SEU Detection Intel® FPGA IP
2.4.1. Advanced SEU Detection Intel® FPGA IP x
2.4.1.1. Release Information for Advanced SEU Detection Intel® FPGA IP 2.4.1.2. On-Chip Lookup Sensitivity Processing 2.4.1.3. Off-Chip Lookup Sensitivity Processing 2.4.1.4. Sensitivity Map Header Lookup
2.5. Design Hierarchy Sensitivity Classification x
2.5.1. Hierarchy Tagging
2.6. Evaluation of System Response to Upsets x
2.6.1. Fault Injection Debugger
3. Secure Device Manager ECC and SmartVID Errors Detection x
3.1. SDM ECC Error Message Bits 3.2. SmartVID Error Message Bits 3.3. SDM ECC and SmartVID Errors Signals Behavior
4. Agilex™ 7 SEU Mitigation Implementation Guides x
4.1. Setting the SEU_ERROR Pin 4.2. Setting Up the SEU Mitigation Features 4.3. Enabling Priority Scrubbing 4.4. Assigning Regions for Hierarchy Tagging 4.5. Sensitivity Map Header 4.6. Using the Fault Injection Debugger
4.5. Sensitivity Map Header x
4.5.1. Programming the .smh File into Memory 4.5.2. Looking up the Sensitivity Map Header
4.5.2. Looking up the Sensitivity Map Header x
4.5.2.1. Sensitivity Map Header Revision 4 File Format Reference
4.6. Using the Fault Injection Debugger x
4.6.1. Launching and Setting Up the Fault Injection Debugger 4.6.2. Configuring Your Device using a Software Object File (.sof) 4.6.3. Constraining Regions for Fault Injection 4.6.4. Injecting Errors to Random Locations 4.6.5. Injecting Errors to Specific Locations 4.6.6. Injecting Double Adjacent Errors 4.6.7. Injecting SDM ECC Errors 4.6.8. Analyzing SEU or SDM ECC Errors Using Signal Tap
4.6.6. Injecting Double Adjacent Errors x
4.6.6.1. Injecting Double Adjacent Errors: Command-Line Interface 4.6.6.2. Injecting Double Adjacent Errors: GUI with Tcl Console
4.6.7. Injecting SDM ECC Errors x
4.6.7.1. Injecting SDM ECC Errors: Command-Line Interface 4.6.7.2. Injecting SDM ECC Errors: GUI
5. IP and Software References x
5.1. Advanced SEU Detection Intel® FPGA IP References 5.2. Fault Injection Debugger Software References
5.1. Advanced SEU Detection Intel® FPGA IP References x
5.1.1. Advanced SEU Detection Intel® FPGA IP Parameter Settings 5.1.2. Advanced SEU Detection Intel® FPGA IP Ports
5.2. Fault Injection Debugger Software References x
5.2.1. Fault Injection Debugger GUI Tool 5.2.2. Fault Injection Debugger Command-Line Interface
1. Agilex™ 7 SEU Mitigation Overview
2. Agilex™ 7 CRAM Error Mitigation
3. Secure Device Manager ECC and SmartVID Errors Detection
4. Agilex™ 7 SEU Mitigation Implementation Guides
5. IP and Software References
6. Agilex™ 7 SEU Mitigation User Guide Archives
7. Document Revision History for the Agilex™ 7 SEU Mitigation User Guide

2.1. CRAM Error Detection and Correction

Agilex™ 7 devices feature on-chip EDC circuitry to detect soft errors. If you enable the internal scrubbing feature, the Agilex™ 7 FPGA corrects an error caused by an SEU event if it is correctable.
Table 3.  Detection and Correction of Error Types
Error Type Detection Correction
Single bit error Yes Yes
Double adjacent errors Yes Yes
Multiple bits error Yes —

The following figure shows the EDC operation. For a given Agilex™ 7 device, the total sectors are divided equally into groups. The number of sectors per group are based on Smax, which is the maximum number of sectors allowed to run the EDC operation concurrently in a same thread. The Smax has device dependency. You can get the Smax details in the System Window: the number of thread(s). In this case, Smax = 5, each group runs at a different thread during SEU detection and correction. The first group runs the EDC process at time T0. This is followed by the second and third group at time T1 and T2 respectively, until the last available group. The time duration to complete one cycle of the EDC process for all the groups is the minimum SEU interval of the device.

Figure 1. EDC Operation
Note: For information about the embedded memory ECC feature, refer to the related information.
Related Information
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