PCB Stackup Design Considerations for Intel® FPGAs

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ID 683883
Date 6/28/2017
Public
Document Table of Contents
Document Table of Contents x
1. PCB Stackup Design Considerations for Intel® FPGAs
1. PCB Stackup Design Considerations for Intel® FPGAs x
1.1. PCB Stackup Construction 1.2. Material Selection 1.3. Glass Transition Temperature 1.4. PCB Stackup Design 1.5. PCB Panelization 1.6. Conclusion 1.7. Specific Recommendations for Intel® FPGA Devices 1.8. References 1.9. Document Revision History
1.2. Material Selection x
1.2.1. Material Loss Considerations
1.2.1. Material Loss Considerations x
1.2.1.1. Relative Dielectric Constant 1.2.1.2. Loss Tangent 1.2.1.3. Fiberglass Weave Composition 1.2.1.4. Skin Effect
1.4. PCB Stackup Design x
1.4.1. Layer Count 1.4.2. Signal Layers 1.4.3. High Speed Signal Layer Planning 1.4.4. Power and Ground Layers 1.4.5. Power Plane and Capacitor Placement Strategy 1.4.6. Planar Capacitance and Spreading Inductance 1.4.7. Plane Layer Separation 1.4.8. Copper Weight 1.4.9. Hybrid Construction
1.4.5. Power Plane and Capacitor Placement Strategy x
1.4.5.1. General Rules for Capacitor and Power Plane Placement 1.4.5.2. Rules for Transceiver Power Plane Placement 1.4.5.3. Rules for High-Current Power Rails 1.4.5.4. Rules for PLL and Other Power Rails
1.7. Specific Recommendations for Intel® FPGA Devices x
1.7.1. Stratix® 10 Device Recommendations 1.7.2. Stratix® V Device Recommendations 1.7.3. Stratix IV Device Recommendations 1.7.4. Arria® 10 Device Recommendations 1.7.5. Arria® V Device Recommendations 1.7.6. Arria II Device Recommendations 1.7.7. Cyclone® 10 Device Recommendations 1.7.8. Cyclone® V Device Recommendations 1.7.9. Cyclone® IV Device Recommendations 1.7.10. Cyclone III Device Recommendations
1.7.1. Stratix® 10 Device Recommendations x
1.7.1.1. Stratix® 10 Device Family Power Plane Placement Example
1.7.2. Stratix® V Device Recommendations x
1.7.2.1. Stratix® V GX, GT, and GS Family Power Plane Placement Example 1.7.2.2. Stratix® V E Family Power Plane Placement Example 1.7.2.3. Stratix® V Transceiver Channel Breakout Recommendations
1.7.3. Stratix IV Device Recommendations x
1.7.3.1. Stratix IV GX and GT Family Power Plane Placement Example 1.7.3.2. Stratix IV E Family Power Plane Placement Example
1.7.4. Arria® 10 Device Recommendations x
1.7.4.1. Arria® 10 Device Family Power Plane Placement Example
1.7.5. Arria® V Device Recommendations x
1.7.5.1. Arria® V Device Family Power Plane Placement Example
1.7.6. Arria II Device Recommendations x
1.7.6.1. Arria II GX Family Power Plane Placement Example
1.7.7. Cyclone® 10 Device Recommendations x
1.7.7.1. Cyclone® 10 LP Device Family Power Plane Placement Example
1.7.8. Cyclone® V Device Recommendations x
1.7.8.1. Cyclone® V Device Family Power Plane Placement Example
1.7.9. Cyclone® IV Device Recommendations x
1.7.9.1. Cyclone® IV GX Family Power Plane Placement Example 1.7.9.2. Cyclone® IV E Family Power Plane Placement Example
1.7.10. Cyclone III Device Recommendations x
1.7.10.1. Cyclone III Family Power Plane Placement Example
1. PCB Stackup Design Considerations for Intel® FPGAs

1.7.2.3. Stratix® V Transceiver Channel Breakout Recommendations

For Stratix® V GX, GT, and GS devices, some transceiver TX channel pins are located near regular I/O pins
Figure 17.  Stratix® V I/O Adjacent to TX Pins
For these pins, crosstalk coupling from the I/O pins to the TX pins can degrade the TX channel performance. To minimize the coupling, do the following:
  • If possible, avoid using those I/O pins and assign them as outputs driving ground in the Stratix® V software.
  • If it is necessary to use those I/Os pins near the TX pins, assign lower voltage swing I/Os to those pins and avoid using 3.0 V or 2.5 V I/O standards. The following I/O standards are preferred for use on those I/O pins:
    • LVDS
    • SSTL or HSTL (1.2 V, 1.5 V, or 1.8 V)
    • 1.2 V non-voltage referenced I/O standard
    • 1.5 V non-voltage referenced I/O standard
    • 1.8 V non-voltage referenced I/O standard
  • Choose lower current drive strength whenever possible.
  • Assign low voltage I/O functions that switch less frequently.
  • Apply internal terminations where possible to reduce overshoot and ringing.
  • Limit the inductive coupling region between the I/O and TX pins. You can do this by limiting the depth of the I/O signal breakout to specific routing layers. Intel® FPGA recommends limiting those I/O breakouts to a depth of 40 mils or less to reduce the mutual inductive coupling region of the I/O and TX breakout via.
Figure 18. Limiting Mutual Inductive Coupling
Level Two Title