Intel® Quartus® Prime Pro Edition User Guide: Timing Analyzer

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ID 683243
Date 10/04/2021
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Document Table of Contents
Document Table of Contents x
1. Timing Analysis Introduction 2. Using the Intel® Quartus® Prime Timing Analyzer A. Intel® Quartus® Prime Pro Edition User Guides
1. Timing Analysis Introduction x
1.1. Timing Analysis Basic Concepts 1.2. Timing Analysis Overview Document Revision History
1.1. Timing Analysis Basic Concepts x
1.1.1. Timing Path and Clock Analysis 1.1.2. Clock Setup Analysis 1.1.3. Clock Hold Analysis 1.1.4. Recovery and Removal Analysis 1.1.5. Multicycle Path Analysis 1.1.6. Metastability Analysis 1.1.7. Timing Pessimism 1.1.8. Clock-As-Data Analysis 1.1.9. Multicorner Timing Analysis 1.1.10. Time Borrowing
1.1.1. Timing Path and Clock Analysis x
1.1.1.1. The Timing Netlist 1.1.1.2. Timing Paths 1.1.1.3. Data and Clock Arrival Times 1.1.1.4. Launch and Latch Edges
1.1.5. Multicycle Path Analysis x
1.1.5.1. Multicycle Clock Hold 1.1.5.2. Multicycle Clock Setup
1.1.10. Time Borrowing x
1.1.10.1. Time Borrowing Limitations 1.1.10.2. Time Borrowing with Latches
2. Using the Intel® Quartus® Prime Timing Analyzer x
2.1. Timing Analysis Flow 2.2. Step 1: Specify Timing Analyzer Settings 2.3. Step 2: Specify Timing Constraints 2.4. Step 3: Run the Timing Analyzer 2.5. Step 4: Analyze Timing Reports 2.6. Applying Timing Constraints 2.7. Timing Analyzer Tcl Commands 2.8. Timing Analysis of Imported Compilation Results 2.9. Using the Intel® Quartus® Prime Timing Analyzer Document Revision History 2.10. Intel® Quartus® Prime Pro Edition User Guide: Timing Analyzer Archive
2.4. Step 3: Run the Timing Analyzer x
2.4.1. Setting the Operating Conditions 2.4.2. Enabling Time Borrowing Optimization
2.5. Step 4: Analyze Timing Reports x
2.5.1. Generating Timing Reports 2.5.2. Cross-Probing with Design Assistant 2.5.3. Launching Design Assistant from Timing Analyzer 2.5.4. Locating Timing Paths in Other Tools 2.5.5. Correlating Constraints to the Timing Report
2.5.1. Generating Timing Reports x
2.5.1.1. Report Fmax Summary 2.5.1.2. Report Timing 2.5.1.3. Report Data Delay 2.5.1.4. Report Clocks and Clock Networks 2.5.1.5. Report Clock Transfers 2.5.1.6. Report Logic Depth 2.5.1.7. Report Neighbor Paths 2.5.1.8. Report Register Spread 2.5.1.9. Report Route Net of Interest 2.5.1.10. Report Retiming Restrictions 2.5.1.11. Report Reset Statistics 2.5.1.12. Report Pipelining Information 2.5.1.13. Report Asynchronous CDC 2.5.1.14. Report CDC Viewer 2.5.1.15. Report Time Borrowing Data 2.5.1.16. Report Exceptions and Exceptions Reachability
2.5.1.8. Report Register Spread x
2.5.1.8.1. Registers with High Timing Path Endpoint Tension 2.5.1.8.2. Registers with High Immediate Fan-Out Tension
2.5.2. Cross-Probing with Design Assistant x
2.5.2.1. Cross-Probing from Design Assistant to Timing Analyzer
2.6. Applying Timing Constraints x
2.6.1. Recommended Initial SDC Constraints 2.6.2. SDC File Precedence 2.6.3. Modifying Iterative Constraints 2.6.4. Using Entity-bound SDC Files 2.6.5. Creating Clocks and Clock Constraints 2.6.6. Creating I/O Constraints 2.6.7. Creating Delay and Skew Constraints 2.6.8. Creating Timing Exceptions 2.6.9. Using Fitter Overconstraints 2.6.10. Example Circuit and SDC File
2.6.1. Recommended Initial SDC Constraints x
2.6.1.1. Create Clock (create_clock) 2.6.1.2. Derive PLL Clocks (derive_pll_clocks) 2.6.1.3. Derive Clock Uncertainty (derive_clock_uncertainty) 2.6.1.4. Set Clock Groups (set_clock_groups)
2.6.4. Using Entity-bound SDC Files x
2.6.4.1. Entity-bound Constraint Scope 2.6.4.2. Entity-bound Constraint Examples
2.6.5. Creating Clocks and Clock Constraints x
2.6.5.1. Creating Base Clocks 2.6.5.2. Creating Virtual Clocks 2.6.5.3. Creating Generated Clocks (create_generated_clock) 2.6.5.4. Deriving PLL Clocks 2.6.5.5. Creating Clock Groups (set_clock_groups) 2.6.5.6. Accounting for Clock Effect Characteristics 2.6.5.7. Constraining CDC Paths
2.6.5.1. Creating Base Clocks x
2.6.5.1.1. Automatic Clock Detection and Constraint Creation
2.6.5.2. Creating Virtual Clocks x
2.6.5.2.1. Specifying I/O Interface Uncertainty 2.6.5.2.2. I/O Interface Clock Uncertainty Example
2.6.5.3. Creating Generated Clocks (create_generated_clock) x
2.6.5.3.1. Clock Divider Example (-divide_by) 2.6.5.3.2. Clock Multiplexer Example
2.6.5.5. Creating Clock Groups (set_clock_groups) x
2.6.5.5.1. Exclusive Clock Groups (-logically_exclusive or -physically_exclusive) 2.6.5.5.2. Asynchronous Clock Groups (-asynchronous) 2.6.5.5.3. set_clock_groups Constraint Tips
2.6.5.6. Accounting for Clock Effect Characteristics x
2.6.5.6.1. Set Clock Latency (set_clock_latency) 2.6.5.6.2. Clock Uncertainty
2.6.6. Creating I/O Constraints x
2.6.6.1. Input Constraints (set_input_delay) 2.6.6.2. Output Constraints (set_output_delay)
2.6.7. Creating Delay and Skew Constraints x
2.6.7.1. Advanced I/O Timing and Board Trace Model Delay 2.6.7.2. Maximum Skew (set_max_skew) 2.6.7.3. Net Delay (set_net_delay)
2.6.8. Creating Timing Exceptions x
2.6.8.1. Timing Exception Precedence 2.6.8.2. False Paths (set_false_path) 2.6.8.3. Minimum and Maximum Delays 2.6.8.4. Multicycle Paths 2.6.8.5. Multicycle Exception Examples 2.6.8.6. Delay Annotation 2.6.8.7. Constraining Design Partition Ports
2.6.8.4. Multicycle Paths x
2.6.8.4.1. Common Multicycle Applications 2.6.8.4.2. Relaxing Setup with Multicycle (set_multicyle_path) 2.6.8.4.3. Accounting for a Phase Shift (-phase)
2.6.8.5. Multicycle Exception Examples x
2.6.8.5.1. Default Multicycle Analysis 2.6.8.5.2. End Multicycle Setup = 2 and End Multicycle Hold = 0 2.6.8.5.3. End Multicycle Setup = 2 and End Multicycle Hold = 1 2.6.8.5.4. Same Frequency Clocks with Destination Clock Offset 2.6.8.5.5. Destination Clock Frequency is a Multiple of the Source Clock Frequency 2.6.8.5.6. Destination Clock Frequency is a Multiple of the Source Clock Frequency with an Offset 2.6.8.5.7. Source Clock Frequency is a Multiple of the Destination Clock Frequency 2.6.8.5.8. Source Clock Frequency is a Multiple of the Destination Clock Frequency with an Offset
2.7. Timing Analyzer Tcl Commands x
2.7.1. The quartus_sta Executable 2.7.2. Collection Commands
2.7.2. Collection Commands x
2.7.2.1. Wildcard Characters 2.7.2.2. Adding and Removing Collection Items 2.7.2.3. Query of Collections 2.7.2.4. Using the get_pins Command
1. Timing Analysis Introduction
2. Using the Intel® Quartus® Prime Timing Analyzer
A. Intel® Quartus® Prime Pro Edition User Guides

2.4.1. Setting the Operating Conditions

Click View > Timing Corners in the Timing Analyzer to specify operating conditions for analysis under different power and temperature ranges. The available operating conditions vary by device and speed grade. The operating conditions represent the "timing corners" in a multi-corner timing analysis.

Select one or more voltage/temperature combinations and double-click Report Timing… under Timing Slack in the Tasks pane to configure the generation of timing analysis reports for that model. The generated report shows the worst-case timing path slack across all operating conditions that you specify. After generating the report for that model, the report shows the worst-case timing path slacks across all operating conditions that you select.

You can use the following context menu options to generate or regenerate reports in the Report window:

  • Regenerate—regenerates the report you select.
  • Regenerate All Out of Date—regenerates all reports that are outdated because of SDC changes since the last generation.
  • Delete All Out of Date—removes all outdated report data.

The following operating conditions are available, depending on your target device and speed grade:

Table 5.  Operating Conditions for Timing Analysis
Model Description Speed Grade Voltage Temperature
Slow 900mV 100C Model High voltage, high temperature Slowest speed grade in device density Vcc minimum supply (1) Maximum TJ (1)
Slow 900mV 0C Model High voltage, low temperature Slowest speed grade in device density Vcc minimum supply (1) Minimum TJ (1)
Fast 900mV 100C Model High voltage, high temperature Fastest speed grade in device density Vcc maximum supply (1) Maximum TJ (1)
Fast 900mV 0C Model High voltage, low temperature Fastest speed grade in device density Vcc maximum supply (1) Minimum TJ (1)
<n> Slow vid<n> 100C Model High voltage, high temperature operating conditions for timing analysis with SmartVID.(2) Slowest speed grade in device density Vcc maximum supply (1) Maximum TJ (1)
<n> Slow vid<n> 0C Model High voltage, low temperature operating conditions for timing analysis with SmartVID.(2) Fastest speed grade in device density Vcc maximum supply (1) Minimum TJ (1)
Slow vid<n> 0C Model (3) High voltage, low temperature operating conditions for timing analysis with SmartVID.(2) Slowest speed grade in device density Vcc maximum supply (1) Minimum TJ (1)
Slow vid<n> 100C Model (3) High voltage, high temperature operating conditions for timing analysis with SmartVID.(2) Slowest speed grade in device density Vcc maximum supply (1) Maximum TJ (1)
Fast vid<n> 0C Model (3) High voltage, low temperature for timing analysis with SmartVID. (2) Fastest speed grade in device density. Vcc maximum supply (1) Minimum TJ (1)
Fast vid<n><a> 100C Model (4) High voltage, high temperature for timing analysis with SmartVID. (2) Fastest speed grade in device density. Vcc maximum supply (1) Maximum TJ (1)
  Note :
  1. Refer to the applicable device Handbook for Vcc and TJ values .
  2. Intel® Stratix® 10 and Intel® Agilex™ SmartVID designs require this additional model to ensure complete coverage.
  3. Intel® Agilex™ devices only.
  4. n refers to the device speed grade. Letters (a, b, and so on) following n refer to different timing corners that capture possible operating conditions. In general, you can consider these letters as somewhat arbitrary labels.

As an alternative to the GUI, you can run the set_operating_conditions command with the -model, -speed, -temperature, and -voltage options to specify the operating conditions. When running set_operating_conditions, you must only specify valid operating conditions for the current device. Run the get_available_operating_conditions command to return a list of all valid operating conditions for the current device.

The following example sets the operating condition to the slow timing model, with a voltage of 1100 mV, and temperature of 85° C: 

set_operating_conditions -model slow -temperature 85 -voltage 1100
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