AN 866: Mitigating and Debugging Single Event Upsets in Intel® Quartus® Prime Standard Edition

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ID 683869
Date 9/28/2021
Public
Document Table of Contents
Document Table of Contents x
1. Mitigating Single Event Upset 2. Debugging Single Event Upset Using the Fault Injection Debugger
1. Mitigating Single Event Upset x
1.1. Failure Rates 1.2. Mitigating SEU Effects in Embedded User RAM 1.3. Mitigating SEU Effects in Configuration RAM 1.4. Internal Scrubbing 1.5. SEU Recovery 1.6. Intel® Quartus® Prime Software SEU FIT Reports 1.7. Triple-Module Redundancy 1.8. Evaluating a System's Response to Functional Upsets 1.9. CRAM Error Detection Settings Reference 1.10. Document Revision History
1.2. Mitigating SEU Effects in Embedded User RAM x
1.2.1. Configuring RAM to Enable ECC
1.5. SEU Recovery x
1.5.1. Planning for SEU Recovery 1.5.2. Designating the Sensitivity of the Design Hierarchy 1.5.3. Advanced SEU Detection IP Core
1.5.2. Designating the Sensitivity of the Design Hierarchy x
1.5.2.1. Hierarchy Tagging 1.5.2.2. Using Partitions to Specify Logic Sensitivity ID
1.5.3. Advanced SEU Detection IP Core x
1.5.3.1. On-Chip Sensitivity Processor 1.5.3.2. External Sensitivity Processor
1.6. Intel® Quartus® Prime Software SEU FIT Reports x
1.6.1. SEU FIT Parameters Report 1.6.2. Projected SEU FIT by Component Usage Report 1.6.3. Enabling the Projected SEU FIT by Component Usage Report
1.6.2. Projected SEU FIT by Component Usage Report x
1.6.2.1. Component FIT Rates 1.6.2.2. Raw FIT 1.6.2.3. Utilized FIT 1.6.2.4. Mitigated FIT 1.6.2.5. Architectural Vulnerability Factor
1.6.2.3. Utilized FIT x
1.6.2.3.1. Comparing .smh Critical Bits Report to Utilized Bit Count 1.6.2.3.2. Considerations for Small Designs
2. Debugging Single Event Upset Using the Fault Injection Debugger x
2.1. Single Event Upset Mitigation 2.2. Hardware and Software Requirements 2.3. Using the Fault Injection Debugger and IP Core 2.4. Document Revision History
2.3. Using the Fault Injection Debugger and IP Core x
2.3.1. Instantiating the IP Core 2.3.2. Defining Fault Injection Areas 2.3.3. Using the Fault Injection Debugger 2.3.4. Command-Line Interface
2.3.1. Instantiating the IP Core x
2.3.1.1. About the EMR Unloader IP Core 2.3.1.2. About the Advanced SEU Detection IP Core
2.3.2. Defining Fault Injection Areas x
2.3.2.1. Performing Hierarchy Tagging 2.3.2.2. About SMH Files
2.3.3. Using the Fault Injection Debugger x
2.3.3.1. Configuring Your Device and the Fault Injection Debugger 2.3.3.2. Constraining Regions for Fault Injection 2.3.3.3. Specifying Error Types 2.3.3.4. Injecting Errors 2.3.3.5. Recording Errors 2.3.3.6. Clearing Injected Errors
2.3.4. Command-Line Interface x
2.3.4.1. Targeted Fault Injection Feature 2.3.4.2. Advanced Command-Line Options: ASD Regions and Error Type Weighting
2.3.4.1. Targeted Fault Injection Feature x
2.3.4.1.1. Specifying an Error List From the Command Line 2.3.4.1.2. Specifying an Error List From Prompt Mode 2.3.4.1.3. Determining CRAM Bit Locations
1. Mitigating Single Event Upset
2. Debugging Single Event Upset Using the Fault Injection Debugger

1.6.2.2. Raw FIT

The Intel® Quartus® Prime Projected SEU FIT by Component Usage report provides raw FIT data.
Raw FIT is the FIT rate of the FPGA if the design uses every component. Raw FIT data is not design specific.
Note: The Intel Reliability Report, available on the Intel FPGA web site, also provides reliability data and testing procedures for Intel FPGA devices.

The Intel® Quartus® Prime software computes the FIT for each component using (component Mb × intrinsic FIT/Mb × Neutron Flux Multiplier) for the device family and process node. (For flip flops, “Mb” represents a million flip flops.)

To give the worst-case raw FIT, the report assumes the maximum amount of CRAM that implements MLABs in the device. Thus, the CRAM raw FIT is the sum of CRAM and MLAB entries.

Note: The Intel® Quartus® Prime software counts device bits for target devices using different parameter information than the Reliability Report. Therefore, the Intel® Quartus® Prime RAW SEU FIT rate is different from the EDCRC max FIT Rate based on the Reliability Report data. The EDCRC max FIT rate based on the Reliability Report data represents the likelihood of error in the CRAM indicated by CRC_ERROR pin.
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