Cyclone® 10 GX Device Overview

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ID 683485
Date 4/01/2019
Public
Document Table of Contents
Document Table of Contents x
Intel® Cyclone® 10 GX Device Overview
Intel® Cyclone® 10 GX Device Overview x
Key Advantages of Intel® Cyclone® 10 GX Devices Summary of Intel® Cyclone® 10 GX Features Intel® Cyclone® 10 GX Available Options Intel® Cyclone® 10 GX Maximum Resources Intel® Cyclone® 10 GX Package Plan I/O Vertical Migration for Intel® Cyclone® 10 GX Devices Adaptive Logic Module Variable-Precision DSP Block Embedded Memory Blocks Clock Networks and PLL Clock Sources FPGA General Purpose I/O External Memory Interface PCIe Gen1 and Gen2 Hard IP Enhanced PCS Hard IP for Interlaken and 10 Gbps Ethernet Low Power Serial Transceivers Dynamic and Partial Reconfiguration Enhanced Configuration and Configuration via Protocol SEU Error Detection and Correction Power Management Incremental Compilation Document Revision History for Intel® Cyclone® 10 GX Device Overview
Embedded Memory Blocks x
Types of Embedded Memory Embedded Memory Capacity in Intel® Cyclone® 10 GX Devices Embedded Memory Configurations for Single-port Mode
Clock Networks and PLL Clock Sources x
Clock Networks Fractional Synthesis and I/O PLLs
Fractional Synthesis and I/O PLLs x
Fractional Synthesis PLLs I/O PLLs
External Memory Interface x
Memory Standards Supported by Intel® Cyclone® 10 GX Devices
Enhanced PCS Hard IP for Interlaken and 10 Gbps Ethernet x
Interlaken Support 10 Gbps Ethernet Support
Low Power Serial Transceivers x
Transceiver Channels PMA Features PCS Features
PCS Features x
PCS Protocol Support
Dynamic and Partial Reconfiguration x
Dynamic Reconfiguration Partial Reconfiguration
Intel® Cyclone® 10 GX Device Overview

SEU Error Detection and Correction

Intel® Cyclone® 10 GX devices offer robust and easy-to-use single-event upset (SEU) error detection and correction circuitry.

The detection and correction circuitry includes protection for Configuration RAM (CRAM) programming bits and user memories. The CRAM is protected by a continuously running CRC error detection circuit with integrated ECC that automatically corrects one or two errors and detects higher order multi-bit errors. When more than two errors occur, correction is available through reloading of the core programming file, providing a complete design refresh while the FPGA continues to operate.

The physical layout of the Intel® Cyclone® 10 GX CRAM array is optimized to make the majority of multi-bit upsets appear as independent single-bit or double-bit errors which are automatically corrected by the integrated CRAM ECC circuitry. In addition to the CRAM protection, the M20K memory blocks also include integrated ECC circuitry and are layout-optimized for error detection and correction. The MLAB does not have ECC.

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