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Supply Current and Power Consumption
I/O Pin Leakage Current
Bus Hold Parameters
Series OCT without Calibration Specifications
Series OCT with Calibration at Device Power-Up Specifications
OCT Variation after Calibration at Device Power-Up
Pin Capacitance
Internal Weak Pull-Up Resistor
Hot-Socketing Specifications
Hysteresis Specifications for Schmitt Trigger Input
Single-Ended I/O Standards Specifications
Single-Ended SSTL, HSTL, and HSUL I/O Reference Voltage Specifications
Single-Ended SSTL, HSTL, and HSUL I/O Standards Signal Specifications
Differential SSTL I/O Standards Specifications
Differential HSTL and HSUL I/O Standards Specifications
Differential I/O Standards Specifications
True PPDS and Emulated PPDS_E_3R Transmitter Timing Specifications
True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications
Emulated RSDS_E_1R Transmitter Timing Specifications
True Mini-LVDS and Emulated Mini-LVDS_E_3R Transmitter Timing Specifications
True LVDS Transmitter Timing
Emulated LVDS_E_3R, SLVS, and Sub-LVDS Transmitter Timing Specifications
LVDS, TMDS, HiSpi, SLVS, and Sub-LVDS Receiver Timing Specifications
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Absolute Maximum Ratings
This section defines the maximum operating conditions for Intel® MAX® 10 devices. The values are based on experiments conducted with the devices and theoretical modeling of breakdown and damage mechanisms. The functional operation of the device is not implied for these conditions.
CAUTION:
Conditions outside the range listed in the absolute maximum ratings tables may cause permanent damage to the device. Additionally, device operation at the absolute maximum ratings for extended periods of time may have adverse effects on the device.