Intel® Stratix® 10 SEU Mitigation User Guide

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ID 683602
Date 12/30/2022
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Document Table of Contents
Document Table of Contents x
1. Intel® Stratix® 10 SEU Mitigation Overview 2. Intel® Stratix® 10 Mitigation Techniques for CRAM 3. Secure Device Manager ECC Error Detection 4. Intel® Stratix® 10 SEU Mitigation Implementation Guides 5. Advanced SEU Detection Intel® FPGA IP References 6. Intel® Stratix® 10 Fault Injection Debugger References 7. Intel® Stratix® 10 SEU Mitigation User Guide Archives 8. Document Revision History for the Intel® Stratix® 10 SEU Mitigation User Guide
1. Intel® Stratix® 10 SEU Mitigation Overview x
1.1. SEU Mitigation Techniques for Intel® Stratix® 10 Devices 1.2. Configuration RAM 1.3. Memory Blocks Error Correction Code (ECC) Support 1.4. Secure Device Manager ECC Error 1.5. Triple-Module Redundancy 1.6. Failure Rates
2. Intel® Stratix® 10 Mitigation Techniques for CRAM x
2.1. CRAM Error Detection and Correction 2.2. Internal Scrubbing and Priority Scrubbing 2.3. SEU Sensitivity Processing 2.4. Designating the Sensitivity of the Design Hierarchy 2.5. Evaluating a System's Response to Functional Upsets
2.1. CRAM Error Detection and Correction x
2.1.1. Error Message Queue 2.1.2. SEU_ERROR Pin Behavior
2.2. Internal Scrubbing and Priority Scrubbing x
2.2.1. Internal Scrubbing 2.2.2. Priority Scrubbing
2.3. SEU Sensitivity Processing x
2.3.1. Advanced SEU Detection IP Core
2.3.1. Advanced SEU Detection IP Core x
2.3.1.1. Release Information for Advanced SEU Detection Intel® FPGA IP 2.3.1.2. On-Chip Lookup Sensitivity Processing 2.3.1.3. Off-Chip Lookup Sensitivity Processing 2.3.1.4. SMH Lookup
2.3.1.3. Off-Chip Lookup Sensitivity Processing x
2.3.1.3.1. Off-Chip Lookup Sensitivity Processing Operation Flow
2.3.1.4. SMH Lookup x
2.3.1.4.1. SMH Revision 4 File Format
2.4. Designating the Sensitivity of the Design Hierarchy x
2.4.1. Hierarchy Tagging
2.5. Evaluating a System's Response to Functional Upsets x
2.5.1. Intel® Quartus® Prime Fault Injection Debugger
3. Secure Device Manager ECC Error Detection x
3.1. SDM ECC Error Message Bits 3.2. SDM ECC Error Signals Behavior
4. Intel® Stratix® 10 SEU Mitigation Implementation Guides x
4.1. Setting SEU_ERROR Pin 4.2. Intel® Quartus® Prime SEU Software Settings 4.3. Enabling Priority Scrubbing 4.4. Performing Hierarchy Tagging 4.5. Programming Sensitivity Map Header File into Memory 4.6. Performing Lookup for Sensitivity Map Header 4.7. Using the Fault Injection Debugger 4.8. Analyzing SEU Errors Using Signal Tap 4.9. Intel® Quartus® Prime Software SEU FIT Reports
4.7. Using the Fault Injection Debugger x
4.7.1. Enabling the Fault Injection Debugger 4.7.2. Launching and Setting Up the Fault Injection Debugger 4.7.3. Configuring Your Device and the Fault Injection Debugger 4.7.4. Constraining Regions for Fault Injection 4.7.5. Injecting Errors 4.7.6. Injecting Double Adjacent Errors
4.7.5. Injecting Errors x
4.7.5.1. Injecting Errors to a Random Location 4.7.5.2. Injecting Errors to a Specific Location
4.7.6. Injecting Double Adjacent Errors x
4.7.6.1. Injecting Double Adjacent Errors: Command-Line Interface 4.7.6.2. Injecting Double Adjacent Errors: GUI
4.9. Intel® Quartus® Prime Software SEU FIT Reports x
4.9.1. Enabling the Projected SEU FIT by Component Usage Report 4.9.2. SEU FIT Parameters Report 4.9.3. Projected SEU FIT by Component Usage Report
4.9.3. Projected SEU FIT by Component Usage Report x
4.9.3.1. Component FIT Rates 4.9.3.2. Raw FIT 4.9.3.3. Utilized FIT 4.9.3.4. Mitigated FIT 4.9.3.5. Architectural Vulnerability Factor
4.9.3.3. Utilized FIT x
4.9.3.3.1. Comparing .smh Critical Bits Report to Utilized Bit Count 4.9.3.3.2. Considerations for Small Designs
5. Advanced SEU Detection Intel® FPGA IP References x
5.1. Advanced SEU Detection Intel® FPGA IP Parameter Settings 5.2. Advanced SEU Detection IP Core Ports
6. Intel® Stratix® 10 Fault Injection Debugger References x
6.1. Fault Injection Debugger Interface Parameters 6.2. Fault Injection Debugger Command-Line Interface
1. Intel® Stratix® 10 SEU Mitigation Overview
2. Intel® Stratix® 10 Mitigation Techniques for CRAM
3. Secure Device Manager ECC Error Detection
4. Intel® Stratix® 10 SEU Mitigation Implementation Guides
5. Advanced SEU Detection Intel® FPGA IP References
6. Intel® Stratix® 10 Fault Injection Debugger References
7. Intel® Stratix® 10 SEU Mitigation User Guide Archives
8. Document Revision History for the Intel® Stratix® 10 SEU Mitigation User Guide

2.1. CRAM Error Detection and Correction

Intel® Stratix® 10 devices feature on-chip EDC circuitry to detect soft errors. If an error caused by SEU event is correctable, the Intel® Stratix® 10 FPGA corrects it if you enable the internal scrubbing feature.

Table 2.  Detection and Correction of Error Types
Error Type Detection Correction
Single bit error Yes Yes
Double adjacent errors Yes1 —
Multiple bit errors Detects up to 8 CRAM bits that fit in a rectangular box of 8 CRAM bits (8x1, 4x2, 1x8 or 2x4 errors) —

The following figure shows the EDC operation. For a given Intel® Stratix® 10 device, the total sectors are divided equally into groups. The number of sectors per group are based on Smax, which is the maximum number of sectors allowed to run the EDC operation concurrently in a same thread. The Smax has device dependency. You can get the Smax details in the System Window: the number of thread(s). In this case, Smax = 2, each group runs at a different thread during SEU detection and correction. The first group will run the EDC process at time T0. This is followed by the second and third group at time T1 and T2 respectively, until the last available group. The time duration to complete one cycle of the EDC process for all the groups is the minimum SEU interval of the device.

Figure 1. EDC Operation
Note: For information about the embedded memory ECC feature, refer to the related information.

Section Content
Error Message Queue
SEU_ERROR Pin Behavior

Related Information
1 In Intel® Stratix® 10 devices, double adjacent errors are also detected as multiple bit errors.
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