Intel® Stratix® 10 SEU Mitigation User Guide

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ID 683602
Date 12/30/2022
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Document Table of Contents
Document Table of Contents x
1. Intel® Stratix® 10 SEU Mitigation Overview 2. Intel® Stratix® 10 Mitigation Techniques for CRAM 3. Secure Device Manager ECC Error Detection 4. Intel® Stratix® 10 SEU Mitigation Implementation Guides 5. Advanced SEU Detection Intel® FPGA IP References 6. Intel® Stratix® 10 Fault Injection Debugger References 7. Intel® Stratix® 10 SEU Mitigation User Guide Archives 8. Document Revision History for the Intel® Stratix® 10 SEU Mitigation User Guide
1. Intel® Stratix® 10 SEU Mitigation Overview x
1.1. SEU Mitigation Techniques for Intel® Stratix® 10 Devices 1.2. Configuration RAM 1.3. Memory Blocks Error Correction Code (ECC) Support 1.4. Secure Device Manager ECC Error 1.5. Triple-Module Redundancy 1.6. Failure Rates
2. Intel® Stratix® 10 Mitigation Techniques for CRAM x
2.1. CRAM Error Detection and Correction 2.2. Internal Scrubbing and Priority Scrubbing 2.3. SEU Sensitivity Processing 2.4. Designating the Sensitivity of the Design Hierarchy 2.5. Evaluating a System's Response to Functional Upsets
2.1. CRAM Error Detection and Correction x
2.1.1. Error Message Queue 2.1.2. SEU_ERROR Pin Behavior
2.2. Internal Scrubbing and Priority Scrubbing x
2.2.1. Internal Scrubbing 2.2.2. Priority Scrubbing
2.3. SEU Sensitivity Processing x
2.3.1. Advanced SEU Detection IP Core
2.3.1. Advanced SEU Detection IP Core x
2.3.1.1. Release Information for Advanced SEU Detection Intel® FPGA IP 2.3.1.2. On-Chip Lookup Sensitivity Processing 2.3.1.3. Off-Chip Lookup Sensitivity Processing 2.3.1.4. SMH Lookup
2.3.1.3. Off-Chip Lookup Sensitivity Processing x
2.3.1.3.1. Off-Chip Lookup Sensitivity Processing Operation Flow
2.3.1.4. SMH Lookup x
2.3.1.4.1. SMH Revision 4 File Format
2.4. Designating the Sensitivity of the Design Hierarchy x
2.4.1. Hierarchy Tagging
2.5. Evaluating a System's Response to Functional Upsets x
2.5.1. Intel® Quartus® Prime Fault Injection Debugger
3. Secure Device Manager ECC Error Detection x
3.1. SDM ECC Error Message Bits 3.2. SDM ECC Error Signals Behavior
4. Intel® Stratix® 10 SEU Mitigation Implementation Guides x
4.1. Setting SEU_ERROR Pin 4.2. Intel® Quartus® Prime SEU Software Settings 4.3. Enabling Priority Scrubbing 4.4. Performing Hierarchy Tagging 4.5. Programming Sensitivity Map Header File into Memory 4.6. Performing Lookup for Sensitivity Map Header 4.7. Using the Fault Injection Debugger 4.8. Analyzing SEU Errors Using Signal Tap 4.9. Intel® Quartus® Prime Software SEU FIT Reports
4.7. Using the Fault Injection Debugger x
4.7.1. Enabling the Fault Injection Debugger 4.7.2. Launching and Setting Up the Fault Injection Debugger 4.7.3. Configuring Your Device and the Fault Injection Debugger 4.7.4. Constraining Regions for Fault Injection 4.7.5. Injecting Errors 4.7.6. Injecting Double Adjacent Errors
4.7.5. Injecting Errors x
4.7.5.1. Injecting Errors to a Random Location 4.7.5.2. Injecting Errors to a Specific Location
4.7.6. Injecting Double Adjacent Errors x
4.7.6.1. Injecting Double Adjacent Errors: Command-Line Interface 4.7.6.2. Injecting Double Adjacent Errors: GUI
4.9. Intel® Quartus® Prime Software SEU FIT Reports x
4.9.1. Enabling the Projected SEU FIT by Component Usage Report 4.9.2. SEU FIT Parameters Report 4.9.3. Projected SEU FIT by Component Usage Report
4.9.3. Projected SEU FIT by Component Usage Report x
4.9.3.1. Component FIT Rates 4.9.3.2. Raw FIT 4.9.3.3. Utilized FIT 4.9.3.4. Mitigated FIT 4.9.3.5. Architectural Vulnerability Factor
4.9.3.3. Utilized FIT x
4.9.3.3.1. Comparing .smh Critical Bits Report to Utilized Bit Count 4.9.3.3.2. Considerations for Small Designs
5. Advanced SEU Detection Intel® FPGA IP References x
5.1. Advanced SEU Detection Intel® FPGA IP Parameter Settings 5.2. Advanced SEU Detection IP Core Ports
6. Intel® Stratix® 10 Fault Injection Debugger References x
6.1. Fault Injection Debugger Interface Parameters 6.2. Fault Injection Debugger Command-Line Interface
1. Intel® Stratix® 10 SEU Mitigation Overview
2. Intel® Stratix® 10 Mitigation Techniques for CRAM
3. Secure Device Manager ECC Error Detection
4. Intel® Stratix® 10 SEU Mitigation Implementation Guides
5. Advanced SEU Detection Intel® FPGA IP References
6. Intel® Stratix® 10 Fault Injection Debugger References
7. Intel® Stratix® 10 SEU Mitigation User Guide Archives
8. Document Revision History for the Intel® Stratix® 10 SEU Mitigation User Guide

4.9.3.2. Raw FIT

The Intel® Quartus® Prime Projected SEU FIT by Component Usage report provides raw FIT data.
Raw FIT is the FIT rate of the FPGA if the design uses every component. Raw FIT data is not design specific.
Note: The Intel Reliability Report, available on the Intel FPGA web site, also provides reliability data and testing procedures for Intel FPGA devices.

The Intel® Quartus® Prime software computes the FIT for each component using (component Mb × intrinsic FIT/Mb × Neutron Flux Multiplier) for the device family and process node. (For flip flops, “Mb” represents a million flip flops.)

To give the worst-case raw FIT, the report assumes the maximum amount of CRAM that implements MLABs in the device. Thus, the CRAM raw FIT is the sum of CRAM and MLAB entries.

Note: The Intel® Quartus® Prime software counts device bits for target devices using different parameter information than the Reliability Report. Therefore, the Intel® Quartus® Prime RAW SEU FIT rate is different from the EDCRC max FIT Rate based on the Reliability Report data. The EDCRC max FIT rate based on the Reliability Report data represents the likelihood of error in the CRAM indicated by CRC_ERROR pin.
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