Intel® Stratix® 10 SEU Mitigation User Guide

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ID 683602
Date 12/30/2022
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Document Table of Contents
Document Table of Contents x
1. Intel® Stratix® 10 SEU Mitigation Overview 2. Intel® Stratix® 10 Mitigation Techniques for CRAM 3. Secure Device Manager ECC Error Detection 4. Intel® Stratix® 10 SEU Mitigation Implementation Guides 5. Advanced SEU Detection Intel® FPGA IP References 6. Intel® Stratix® 10 Fault Injection Debugger References 7. Intel® Stratix® 10 SEU Mitigation User Guide Archives 8. Document Revision History for the Intel® Stratix® 10 SEU Mitigation User Guide
1. Intel® Stratix® 10 SEU Mitigation Overview x
1.1. SEU Mitigation Techniques for Intel® Stratix® 10 Devices 1.2. Configuration RAM 1.3. Memory Blocks Error Correction Code (ECC) Support 1.4. Secure Device Manager ECC Error 1.5. Triple-Module Redundancy 1.6. Failure Rates
2. Intel® Stratix® 10 Mitigation Techniques for CRAM x
2.1. CRAM Error Detection and Correction 2.2. Internal Scrubbing and Priority Scrubbing 2.3. SEU Sensitivity Processing 2.4. Designating the Sensitivity of the Design Hierarchy 2.5. Evaluating a System's Response to Functional Upsets
2.1. CRAM Error Detection and Correction x
2.1.1. Error Message Queue 2.1.2. SEU_ERROR Pin Behavior
2.2. Internal Scrubbing and Priority Scrubbing x
2.2.1. Internal Scrubbing 2.2.2. Priority Scrubbing
2.3. SEU Sensitivity Processing x
2.3.1. Advanced SEU Detection IP Core
2.3.1. Advanced SEU Detection IP Core x
2.3.1.1. Release Information for Advanced SEU Detection Intel® FPGA IP 2.3.1.2. On-Chip Lookup Sensitivity Processing 2.3.1.3. Off-Chip Lookup Sensitivity Processing 2.3.1.4. SMH Lookup
2.3.1.3. Off-Chip Lookup Sensitivity Processing x
2.3.1.3.1. Off-Chip Lookup Sensitivity Processing Operation Flow
2.3.1.4. SMH Lookup x
2.3.1.4.1. SMH Revision 4 File Format
2.4. Designating the Sensitivity of the Design Hierarchy x
2.4.1. Hierarchy Tagging
2.5. Evaluating a System's Response to Functional Upsets x
2.5.1. Intel® Quartus® Prime Fault Injection Debugger
3. Secure Device Manager ECC Error Detection x
3.1. SDM ECC Error Message Bits 3.2. SDM ECC Error Signals Behavior
4. Intel® Stratix® 10 SEU Mitigation Implementation Guides x
4.1. Setting SEU_ERROR Pin 4.2. Intel® Quartus® Prime SEU Software Settings 4.3. Enabling Priority Scrubbing 4.4. Performing Hierarchy Tagging 4.5. Programming Sensitivity Map Header File into Memory 4.6. Performing Lookup for Sensitivity Map Header 4.7. Using the Fault Injection Debugger 4.8. Analyzing SEU Errors Using Signal Tap 4.9. Intel® Quartus® Prime Software SEU FIT Reports
4.7. Using the Fault Injection Debugger x
4.7.1. Enabling the Fault Injection Debugger 4.7.2. Launching and Setting Up the Fault Injection Debugger 4.7.3. Configuring Your Device and the Fault Injection Debugger 4.7.4. Constraining Regions for Fault Injection 4.7.5. Injecting Errors 4.7.6. Injecting Double Adjacent Errors
4.7.5. Injecting Errors x
4.7.5.1. Injecting Errors to a Random Location 4.7.5.2. Injecting Errors to a Specific Location
4.7.6. Injecting Double Adjacent Errors x
4.7.6.1. Injecting Double Adjacent Errors: Command-Line Interface 4.7.6.2. Injecting Double Adjacent Errors: GUI
4.9. Intel® Quartus® Prime Software SEU FIT Reports x
4.9.1. Enabling the Projected SEU FIT by Component Usage Report 4.9.2. SEU FIT Parameters Report 4.9.3. Projected SEU FIT by Component Usage Report
4.9.3. Projected SEU FIT by Component Usage Report x
4.9.3.1. Component FIT Rates 4.9.3.2. Raw FIT 4.9.3.3. Utilized FIT 4.9.3.4. Mitigated FIT 4.9.3.5. Architectural Vulnerability Factor
4.9.3.3. Utilized FIT x
4.9.3.3.1. Comparing .smh Critical Bits Report to Utilized Bit Count 4.9.3.3.2. Considerations for Small Designs
5. Advanced SEU Detection Intel® FPGA IP References x
5.1. Advanced SEU Detection Intel® FPGA IP Parameter Settings 5.2. Advanced SEU Detection IP Core Ports
6. Intel® Stratix® 10 Fault Injection Debugger References x
6.1. Fault Injection Debugger Interface Parameters 6.2. Fault Injection Debugger Command-Line Interface
1. Intel® Stratix® 10 SEU Mitigation Overview
2. Intel® Stratix® 10 Mitigation Techniques for CRAM
3. Secure Device Manager ECC Error Detection
4. Intel® Stratix® 10 SEU Mitigation Implementation Guides
5. Advanced SEU Detection Intel® FPGA IP References
6. Intel® Stratix® 10 Fault Injection Debugger References
7. Intel® Stratix® 10 SEU Mitigation User Guide Archives
8. Document Revision History for the Intel® Stratix® 10 SEU Mitigation User Guide

4.9.3.3. Utilized FIT

The Utilized column shows FIT calculations considering only resources that the design actually uses. Since SEU events in unused resources do not affect the FPGA, you can safely ignore these bits for resiliency statistics.
Additionally, the Utilized column discounts unused memory bits. For example, implementing a 16 × 16 memory in an M20K block uses only 256 bits of the 20 Kb.
Note: The Error Detection flag and the Projected SEU FIT by Component report do not distinguish between critical bit upsets, such as fundamental control logic, or non critical bit upsets, such as initialization logic that executes only once in the design. Apply hierarchy tags at the system level to filter out less important logic errors.

The Projected SEU FIT by Component report's Utilized CRAM FIT represents provable deflation of the FIT rate to account for CRAM upsets that do not matter to the design. Thus, the SEU incidence is always higher than the utilized FIT rate.


Section Content
Comparing .smh Critical Bits Report to Utilized Bit Count
Considerations for Small Designs

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