Intel® Stratix® 10 SEU Mitigation User Guide

Download PDF
ID 683602
Date 12/30/2022
Public

A newer version of this document is available. Customers should click here to go to the newest version.

Document Table of Contents
Document Table of Contents x
1. Intel® Stratix® 10 SEU Mitigation Overview 2. Intel® Stratix® 10 Mitigation Techniques for CRAM 3. Secure Device Manager ECC Error Detection 4. Intel® Stratix® 10 SEU Mitigation Implementation Guides 5. Advanced SEU Detection Intel® FPGA IP References 6. Intel® Stratix® 10 Fault Injection Debugger References 7. Intel® Stratix® 10 SEU Mitigation User Guide Archives 8. Document Revision History for the Intel® Stratix® 10 SEU Mitigation User Guide
1. Intel® Stratix® 10 SEU Mitigation Overview x
1.1. SEU Mitigation Techniques for Intel® Stratix® 10 Devices 1.2. Configuration RAM 1.3. Memory Blocks Error Correction Code (ECC) Support 1.4. Secure Device Manager ECC Error 1.5. Triple-Module Redundancy 1.6. Failure Rates
2. Intel® Stratix® 10 Mitigation Techniques for CRAM x
2.1. CRAM Error Detection and Correction 2.2. Internal Scrubbing and Priority Scrubbing 2.3. SEU Sensitivity Processing 2.4. Designating the Sensitivity of the Design Hierarchy 2.5. Evaluating a System's Response to Functional Upsets
2.1. CRAM Error Detection and Correction x
2.1.1. Error Message Queue 2.1.2. SEU_ERROR Pin Behavior
2.2. Internal Scrubbing and Priority Scrubbing x
2.2.1. Internal Scrubbing 2.2.2. Priority Scrubbing
2.3. SEU Sensitivity Processing x
2.3.1. Advanced SEU Detection IP Core
2.3.1. Advanced SEU Detection IP Core x
2.3.1.1. Release Information for Advanced SEU Detection Intel® FPGA IP 2.3.1.2. On-Chip Lookup Sensitivity Processing 2.3.1.3. Off-Chip Lookup Sensitivity Processing 2.3.1.4. SMH Lookup
2.3.1.3. Off-Chip Lookup Sensitivity Processing x
2.3.1.3.1. Off-Chip Lookup Sensitivity Processing Operation Flow
2.3.1.4. SMH Lookup x
2.3.1.4.1. SMH Revision 4 File Format
2.4. Designating the Sensitivity of the Design Hierarchy x
2.4.1. Hierarchy Tagging
2.5. Evaluating a System's Response to Functional Upsets x
2.5.1. Intel® Quartus® Prime Fault Injection Debugger
3. Secure Device Manager ECC Error Detection x
3.1. SDM ECC Error Message Bits 3.2. SDM ECC Error Signals Behavior
4. Intel® Stratix® 10 SEU Mitigation Implementation Guides x
4.1. Setting SEU_ERROR Pin 4.2. Intel® Quartus® Prime SEU Software Settings 4.3. Enabling Priority Scrubbing 4.4. Performing Hierarchy Tagging 4.5. Programming Sensitivity Map Header File into Memory 4.6. Performing Lookup for Sensitivity Map Header 4.7. Using the Fault Injection Debugger 4.8. Analyzing SEU Errors Using Signal Tap 4.9. Intel® Quartus® Prime Software SEU FIT Reports
4.7. Using the Fault Injection Debugger x
4.7.1. Enabling the Fault Injection Debugger 4.7.2. Launching and Setting Up the Fault Injection Debugger 4.7.3. Configuring Your Device and the Fault Injection Debugger 4.7.4. Constraining Regions for Fault Injection 4.7.5. Injecting Errors 4.7.6. Injecting Double Adjacent Errors
4.7.5. Injecting Errors x
4.7.5.1. Injecting Errors to a Random Location 4.7.5.2. Injecting Errors to a Specific Location
4.7.6. Injecting Double Adjacent Errors x
4.7.6.1. Injecting Double Adjacent Errors: Command-Line Interface 4.7.6.2. Injecting Double Adjacent Errors: GUI
4.9. Intel® Quartus® Prime Software SEU FIT Reports x
4.9.1. Enabling the Projected SEU FIT by Component Usage Report 4.9.2. SEU FIT Parameters Report 4.9.3. Projected SEU FIT by Component Usage Report
4.9.3. Projected SEU FIT by Component Usage Report x
4.9.3.1. Component FIT Rates 4.9.3.2. Raw FIT 4.9.3.3. Utilized FIT 4.9.3.4. Mitigated FIT 4.9.3.5. Architectural Vulnerability Factor
4.9.3.3. Utilized FIT x
4.9.3.3.1. Comparing .smh Critical Bits Report to Utilized Bit Count 4.9.3.3.2. Considerations for Small Designs
5. Advanced SEU Detection Intel® FPGA IP References x
5.1. Advanced SEU Detection Intel® FPGA IP Parameter Settings 5.2. Advanced SEU Detection IP Core Ports
6. Intel® Stratix® 10 Fault Injection Debugger References x
6.1. Fault Injection Debugger Interface Parameters 6.2. Fault Injection Debugger Command-Line Interface
1. Intel® Stratix® 10 SEU Mitigation Overview
2. Intel® Stratix® 10 Mitigation Techniques for CRAM
3. Secure Device Manager ECC Error Detection
4. Intel® Stratix® 10 SEU Mitigation Implementation Guides
5. Advanced SEU Detection Intel® FPGA IP References
6. Intel® Stratix® 10 Fault Injection Debugger References
7. Intel® Stratix® 10 SEU Mitigation User Guide Archives
8. Document Revision History for the Intel® Stratix® 10 SEU Mitigation User Guide

2.3. SEU Sensitivity Processing

Reconfiguring a running FPGA has a significant impact on the system using the FPGA. When planning for SEU recovery, account for the time required to bring the FPGA to a state consistent with the current state of the system. For example, if an internal state machine is in an illegal state, it may require reset. In addition, the surrounding logic may need to account for this unexpected operation.

Often an SEU impacts CRAM bits not used by the implemented design. Even in a fully utilized FPGA design, many configuration bits are not used because they control logic and routing wires that are not used in a design. Depending on the implementation, only 40% of all CRAM bits can be used even in the most heavily utilized devices. This means that only 40% of SEU events require intervention, and you can ignore 60% of SEU events. The utilized bits are considered as critical bits while the non-utilized bits are considered as non-critical bits.

Additionally, there may be portions of the implemented design are not utilized in the FPGA’s function. Examples may include test circuitry implemented but not important to the operation of the device, or other non-critical functions that may be logged but do not need to be reprogrammed or reset.

You can perform SEU sensitivity processing using the Advanced SEU Detection IP core.


Section Content
Advanced SEU Detection IP Core

Level Two Title