1.6. Test Results
The following table contains the possible results and their definition.
Result | Definition |
---|---|
PASS | The Device Under Test (DUT) was observed to exhibit conformant behavior. |
PASS with comments | The DUT was observed to exhibit conformant behavior. However, an additional explanation of the situation is included (example: due to time limitations, only a portion of the testing was performed). |
FAIL | The DUT was observed to exhibit non-conformant behavior. |
Warning | The DUT was observed to exhibit behavior that is not recommended. |
Refer to comments | From the observations, a valid pass or fail could not be determined. An additional explanation of the situation is included. |
The following table shows the results for test cases LL.1, LL.2, TL.1, and TL.2 with respective values of L, M, F, lane rate, sampling clock, link clock, and SYSREF frequencies.
No. | L | M | F | DAC Sampling Clock (MHz) | FPGA Device Clock (MHz) | FPGA Frame Clock (MHz) | FPGA Link Clock (MHz) | Lane Rate (Gbps) | Link Layer Test (LL.1, LL.2) | Transport Layer Test (TL.1, TL.2) |
---|---|---|---|---|---|---|---|---|---|---|
1 | 8 | 4 | 1 | 6000.00 | 375.00 | 375.00 | 375.00 | 24.75 | Pass | Pass |