Fault Injection Intel® FPGA IP Core User Guide

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ID 683254
Date 7/09/2019
Public
Document Table of Contents
Document Table of Contents x
1. Fault Injection Intel® FPGA IP Core User Guide
1. Fault Injection Intel® FPGA IP Core User Guide x
1.1. Features 1.2. Device Support 1.3. Resource Utilization and Performance 1.4. Installing and Licensing Intel® FPGA IP Cores 1.5. Customizing and Generating IP Cores 1.6. Functional Description 1.7. Using the Fault Injection Debugger and Fault Injection IP Core 1.8. Fault Injection IP Core User Guide Archives 1.9. Document Revision History for Fault Injection IP Core User Guide
1.5. Customizing and Generating IP Cores x
1.5.1. IP Catalog and Parameter Editor 1.5.2. IP Core Generation Output ( Intel® Quartus® Prime Pro Edition)
1.6. Functional Description x
1.6.1. Single Event Upset Mitigation 1.6.2. Fault Injection IP Pin Description
1.7. Using the Fault Injection Debugger and Fault Injection IP Core x
1.7.1. Instantiating the Fault Injection IP Core 1.7.2. Defining Fault Injection Areas 1.7.3. Using the Fault Injection Debugger 1.7.4. Command-Line Interface
1.7.1. Instantiating the Fault Injection IP Core x
1.7.1.1. About the EMR Unloader IP Core 1.7.1.2. About the Advanced SEU Detection IP Core
1.7.2. Defining Fault Injection Areas x
1.7.2.1. Performing Hierarchy Tagging 1.7.2.2. About SMH Files
1.7.3. Using the Fault Injection Debugger x
1.7.3.1. Hardware and Software Requirements 1.7.3.2. Configuring Your Device and the Fault Injection Debugger 1.7.3.3. Constraining Regions for Fault Injection 1.7.3.4. Specifying Error Types 1.7.3.5. Injecting Errors 1.7.3.6. Recording Errors 1.7.3.7. Clearing Injected Errors
1.7.4. Command-Line Interface x
1.7.4.1. Targeted Fault Injection Feature 1.7.4.2. Advanced Command-Line Options: ASD Regions and Error Type Weighting
1.7.4.1. Targeted Fault Injection Feature x
1.7.4.1.1. Specifying an Error List From the Command Line 1.7.4.1.2. Specifying an Error List From Prompt Mode 1.7.4.1.3. Determining CRAM Bit Locations
1. Fault Injection Intel® FPGA IP Core User Guide

1.1. Features

  • Allows you to evaluate system response for mitigating single event functional interrupts (SEFI).
  • Allows you to perform SEFI characterization in-house, eliminating the need for entire system beam testing. Instead, you can limit the beam testing to failures in time (FIT)/Mb measurement at the device level.
  • Scale FIT rates according to the SEFI characterization that is relevant to your design architecture. You can randomly distribute fault injections throughout the entire device, or constrain them to specific functional areas to speed up testing.
  • Optimize your design to reduce disruption caused by a single event upsets (SEU).
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