Intel® Stratix® 10 JTAG Boundary-Scan Testing User Guide

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ID 683207
Date 7/27/2021
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Document Table of Contents
Document Table of Contents x
1. Intel® Stratix® 10 Overview 2. Intel® Stratix® 10 JTAG BST Architecture 3. Intel® Stratix® 10 BST Operation Control 4. Intel® Stratix® 10 I/O Voltage for JTAG Operation 5. Performing Intel® Stratix® 10 Boundary-Scan Testing 6. Enabling and Disabling Intel® Stratix® 10 BST Circuitry 7. Intel® Stratix® 10 IEEE Std. 1149.1 BST Guidelines 8. Document Revision History for the Intel® Stratix® 10 JTAG Boundary-Scan Testing User Guide
2. Intel® Stratix® 10 JTAG BST Architecture x
2.1. JTAG Circuitry Functional Model 2.2. JTAG Pins 2.3. IEEE Std. 1149.1 Boundary-Scan Register 2.4. IEEE Std. 1149.6 Boundary-Scan Register
2.3. IEEE Std. 1149.1 Boundary-Scan Register x
2.3.1. Boundary-Scan Cells of Intel® Stratix® 10 Device I/O Pin
2.4. IEEE Std. 1149.6 Boundary-Scan Register x
2.4.1. IEEE Std. 1149.6 BST Circuitry for Intel® Stratix® 10 E-Tile Transceiver 2.4.2. IEEE Std. 1149.6 BST Circuitry for Intel® Stratix® 10 P-Tile Transceiver
3. Intel® Stratix® 10 BST Operation Control x
3.1. Device ID 3.2. Supported JTAG Instructions 3.3. JTAG Secure Mode
6. Enabling and Disabling Intel® Stratix® 10 BST Circuitry x
6.1. Enabling BST Circuitry 6.2. Disabling BST Circuitry
1. Intel® Stratix® 10 Overview
2. Intel® Stratix® 10 JTAG BST Architecture
3. Intel® Stratix® 10 BST Operation Control
4. Intel® Stratix® 10 I/O Voltage for JTAG Operation
5. Performing Intel® Stratix® 10 Boundary-Scan Testing
6. Enabling and Disabling Intel® Stratix® 10 BST Circuitry
7. Intel® Stratix® 10 IEEE Std. 1149.1 BST Guidelines
8. Document Revision History for the Intel® Stratix® 10 JTAG Boundary-Scan Testing User Guide

2.3. IEEE Std. 1149.1 Boundary-Scan Register

The boundary-scan register is a large serial shift register that uses the TDI pin as an input and the TDO pin as an output. The boundary-scan register consists of boundary-scan cells for each I/O pin and padding bits. You can use the boundary-scan register to test external pin connections or to capture internal data.

Figure 2.  Boundary-Scan RegisterThis figure shows how test data is serially shifted around the periphery of the IEEE Std. 1149.1 device.
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