Notes for Intel® oneAPI Math Kernel Library Vector Statistics

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Date 12/04/2020
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Document Table of Contents x
Notes for Intel® oneAPI Math Kernel Library Vector Statistics
Notes for Intel® oneAPI Math Kernel Library Vector Statistics x
Introduction Randomness and Scientific Experiment Random Numbers Figures of Merit for Random Number Generators Vector Statistics Structure Testing of Basic Random Number Generators Testing of Distribution Random Number Generators Bibliography Notices and Disclaimers
Introduction x
What's New About Vector Statistics About This Document Conventions
Figures of Merit for Random Number Generators x
Uniform Probability Distribution and Basic Pseudo- and Quasi-Random Number Generators Figures of Merit for General (Non-Uniform) Distribution Generators
Vector Statistics Structure x
Why Vector Type Generators? Basic Random Number Generators Random Streams and RNGs in Parallel Computation Generating Methods for Random Numbers of Non-Uniform Distribution Accurate and Fast Modes of Random Number Generation Example of VS Use
Random Streams and RNGs in Parallel Computation x
Initializing a BRNG Creating and Initializing Random Streams Creating Random Stream Copy and Copying Stream State Saving and Restoring Random Streams Independent Streams. Block-Splitting and Leapfrogging Abstract Basic Random Number Generators. Abstract Streams
Generating Methods for Random Numbers of Non-Uniform Distribution x
Inverse Transformation Acceptance/Rejection Mixture of Distributions Special Properties
Testing of Basic Random Number Generators x
BRNG Implementations and Categories Interpreting Test Results BRNG Test Descriptions BRNG Properties and Testing Results
Interpreting Test Results x
One-Level (Threshold) Testing Two-Level Testing
BRNG Test Descriptions x
3D Spheres Test Birthday Spacing Test Bitstream Test Rank of 31x31 Binary Matrices Test Rank of 32x32 Binary Matrices Test Rank of 6x8 Binary Matrices Test Test Purpose First Level Test  Second Level Test Final Result Interpretation Tested Generators Count-the-1's Test (Stream of Bits) Count-the-1's Test (Stream of Specific Bytes) Craps Test Parking Lot Test Self-Avoiding Random Walk Test Template Test
BRNG Properties and Testing Results x
MCG31m1 R250 MRG32k3a MCG59 WH MT19937 SFMT19937 MT2203 SOBOL NIEDERREITER Philox4x32-10 ARS5
Testing of Distribution Random Number Generators x
Interpreting Test Results Description of Distribution Generator Tests Continuous Distribution Random Number Generators Discrete Distribution Random Number Generators
Description of Distribution Generator Tests x
Confidence Test Distribution Moments Test Chi-Squared Goodness-of-Fit Test Performance
Continuous Distribution Random Number Generators x
Uniform (VSL_RNG_METHOD_UNIFORM_STD/VSL_RNG_METHOD_UNIFORM_STD_ACCURATE) Gaussian (VSL_RNG_METHOD_GAUSSIAN_BOXMULLER) Gaussian (VSL_RNG_METHOD_GAUSSIAN_BOXMULLER2) Gaussian (VSL_RNG_METHOD_GAUSSIAN_ICDF) GaussianMV (VSL_RNG_METHOD_GAUSSIANMV_BOXMULLER) GaussianMV (VSL_RNG_METHOD_GAUSSIANMV_BOXMULLER2) GaussianMV  (VSL_RNG_METHOD_GAUSSIANMV_ICDF) Exponential (VSL_RNG_METHOD_EXPONENTIAL_ICDF/VSL_RNG_METHOD_EXPONENTIAL_ICDF_ACCURATE) Laplace (VSL_RNG_METHOD_LAPLACE_ICDF) Weibull (VSL_RNG_METHOD_WEIBULL_ICDF/ VSL_RNG_METHOD_WEIBULL_ICDF_ACCURATE) Cauchy (VSL_RNG_METHOD_CAUCHY_ICDF) Rayleigh (VSL_RNG_METHOD_RAYLEIGH_ICDF/ VSL_RNG_METHOD_RAYLEIGH_ICDF_ACCURATE) Lognormal (VSL_RNG_METHOD_LOGNORMAL_ BOXMULLER2/VSL_RNG_METHOD_LOGNORMAL_BOXMULLER2_ACCURATE) Lognormal (VSL_RNG_METHOD_LOGNORMAL_ICDF/VSL_RNG_METHOD_LOGNORMAL_ICDF_ACCURATE) Gumbel (VSL_RNG_METHOD_GUMBEL_ICDF) Gamma (VSL_RNG_METHOD_GAMMA_GNORM/ VSL_RNG_METHOD_GAMMA_GNORM_ACCURATE) Beta (VSL_RNG_METHOD_BETA_CJA/ VSL_RNG_METHOD_BETA_CJA_ACCURATE) ChiSquare (VSL_RNG_METHOD_CHISQUARE_CHI2GAMMA)
Discrete Distribution Random Number Generators x
Uniform (VSL_RNG_METHOD_UNIFORM_STD) UniformBits (VSL_RNG_METHOD_UNIFORMBITS_STD) UniformBits32 (VSL_RNG_METHOD_UNIFORMBITS32_STD) UniformBits64 (VSL_RNG_METHOD_UNIFORMBITS64_STD) Bernoulli (VSL_RNG_METHOD_BERNOULLI_ICDF) Geometric (VSL_RNG_METHOD_GEOMETRIC_ICDF) Binomial (VSL_RNG_METHOD_BINOMIAL_BTPE) Hypergeometric (VSL_RNG_METHOD_HYPERGEOMETRIC_H2PE) Poisson (VSL_RNG_METHOD_POISSON_PTPE) Poisson (VSL_RNG_METHOD_POISSON_POISNORM) PoissonV (VSL_RNG_METHOD_POISSONV_POISNORM) NegBinomial (VSL_RNG_METHOD_NEGBINOMIAL_NBAR) Multinomial (VSL_RNG_METHOD_MULTINOMIAL_MULTPOISSON)
Notes for Intel® oneAPI Math Kernel Library Vector Statistics

Rank of 6x8 Binary Matrices Test

Test Purpose

The test evaluates the randomness of the 8-bit groups of 6 sequential random numbers of the integer output. The stable response is the rank of the binary matrix composed of the random numbers. The test checks all possible 8-bit groups: 0-7, 1-8, ...

First Level Test 

The first level test selects, with s fixed, groups of bits bs, bs+ 1, ..., bs+ 7 from each element of the integer output and forms a binary matrix 6x8 in size from these 6 groups. The first level test composes 100000 of such matrices out of sequential elements of the integer output of the generator. Then the test computes the number of matrices with the rank of: 6, 5, or less than 5. The following table shows the probability of these ranks in a truly random sequence:

Rank Probability in a Truly Random Sequence
6 0.773
5 0.217
<5 0.010

Therefore, the test divides all possible matrix ranks into three groups. The test makes a V statistic with a chi-square distribution with two degrees of freedom for these three groups. Then the first level test applies the chi-square goodness-of-fit test to the groups. The testing result is the p-value.

In the table below, NB stands for the number of bits required to represent a random number in integer arithmetic, WS stands for the machine word size, in bits, used in integer random number generation.

NOTE:

The acceptable values of 0 £ s £ NB - 8 are specific for each BRNG. The test checks each of the four elements of the integer output for the WH and SFMT19937 basic generators.

BRNG Integer Output Interpretation
MCG31m1

Array of 32-bit integers. Each 32-bit integer uses the following bits:

 0-30. NB=31, WS=32.

R250

Array of 32-bit integers. Each 32-bit integer uses the following bits:

 0-31. NB=32, WS=32.

MRG32k3a

Array of 32-bit integers. Each 32-bit integer uses the following bits:

 0-31. NB=32, WS=32.

MCG59

Array of 64-bit integers. Each 64-bit integer uses the following bits:

 0-58. NB=59, WS=64.

WH Array of quadruples of 32-bit integers. Each 32-bit integer uses the following bits: 0-23. NB=24, WS=32.
MT19937

Array of 32-bit integers. Each 32-bit integer uses the following bits:

0-31. NB=32, WS=32.

MT2203

Array of 32-bit integers. Each 32-bit integer uses the following bits:

0-31. NB=32, WS=32.

SFMT19937

Array of quadruples of 32-bit integers. Each 32-bit integer uses the following bits:

0-31. NB=32, WS=32.

PHILOX4X32X10

Array of 32-bit integers. Each 32-bit integer uses the following bits:

0-31. NB=32, WS=32.

ARS5

Array of 32-bit integers. Each 32-bit integer uses the following bits:

0-31. NB=32, WS=32.

The test selects only NB of lower bits from each WS-bit integer to form a bit sequence.

Second Level Test

The second level test performs the first level test ten times for the fixed s. The result is a set of p-values pj, j = 1, 2, ..., 10. The test applies the Kolmogorov-Smirnov goodness-of-fit test with Anderson-Darling statistics to the obtained set of pj, j = 1, 2, ..., 10. If the resulting p-value is p < 0.05 or p > 0.95, the test fails for the s.

Final Result Interpretation

The second level test performs ten times for each 0 £ s £ NB - 8. The test computes the FAIL percentage of the failed second level tests. The final result is the minimal percentage of the failed tests FAIL = min(FAIL0, FAIL1, ..., FAILNB-8) for 0 £ s £ NB - 31. The acceptable result is the value of FAIL < 50%. Therefore the test indicates whether it is possible to single out at least 8 random bits out of each element of generator integer output such that six random numbers of eight bits each have a random enough behavior under this particular test.

Tested Generators

Function Name Application 
vsRngUniform
 not applicable 
vdRngUniform
 not applicable 
viRngUniform
 not applicable 
viRngUniformBits
 applicable

The Rank of 6x8 Binary Matrices Test checks each element of the WH generator separately as different multiplicative generators produce its elements.

Parent topic: BRNG Test Descriptions
Level Two Title