1.4.1. DFE Processing in FPGA
- Random access memory (RAM) for TX data generation
- Finite impulse response (FIR) for channel filter
- Half-band filter (HBF) for TX data interpolation
- Gain adjustment for TX data
- Test function
- Single tone
- Increasing sequence
RAM
In the RAM module, you can store 122880 data under 122.88 Mpbs sample rate, which can deliver about 1 ms 100 MHz NR baseband data in time domain.
You can also write your own TX data into this RAM.
FIR
- Transmission bandwidth: 98.28 MHz (273 RB * 12 subcarriers * 30 KHz)
- Rejection: 50 dBs
- Ripple: ±0.02 dBs
- Filter order: 384
- Sample rate: 122.88 MHz
- Fmax: 245.76 MHz
The following figures show the FIR II Intel® FPGA IP parameter setting in the Intel® Quartus® Prime software. You can modify these parameters based on your specific requirements.
HBF
- Transmission bandwidth: 98.28 MHz (273 RB * 12 subcarriers * 30 KHz)
- Rejection: More than 80 dBs
- Ripple: ±0.005 dBs
- Filter order: 54
- Sample rate: 245.76 MHz
- Fmax: 245.76 MHz
The following figures show the FIR II Intel® FPGA IP parameter setting for HBF. You can modify these parameters based on your specific requirements.
Gain
Use gain for TX data gain adjustment. The gain parameter is a 16 bit data.
The 0 dB gain parameter is 10’d512. When the gain parameter is larger than 512, the gain is positive. Otherwise, the gain is negative.
Test Function
Test functions in the design include single tone and increasing sequence. You can also add more test data or modify the test functions.
The following figures show the NCO Intel® FPGA IP parameter setting in the Intel® Quartus® Prime software. You can modify these parameters based on your specific requirement.
The increasing sequence is used for JESD204B loop test. You can capture the RX data by using the Signal Tap Logic Analyzer to check if the JESD204B works well.
always @ ( posedge clk )
begin
loop_test_data_i <= loop_test_data_i + 16'd1;
loop_test_data_q <= loop_test_data_q + 16'd2;
end