AN 539: Test Methodology of Error Detection and Recovery using CRC in Intel FPGA Devices

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ID 683075
Date 8/09/2019
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Document Table of Contents
Document Table of Contents x
1. Test Methodology of Error Detection and Recovery using CRC in Intel® FPGA Devices
1. Test Methodology of Error Detection and Recovery using CRC in Intel® FPGA Devices x
1.1. Functional Description 1.2. Error Correction 1.3. Using the Error Detection CRC Feature 1.4. Error Injection 1.5. Modifying Single-Device .jam Files for Use in a Multi-Device JTAG Chain 1.6. Running .jam Files with the Intel® Quartus® Prime Jam Tools 1.7. Document Revision History for AN 539: Test Methodology of Error Detection and Recovery using CRC in Intel® FPGA Devices
1.1. Functional Description x
1.1.1. Configuration Error Detection 1.1.2. User Mode Error Detection 1.1.3. Error Detection Pin 1.1.4. Error Message Register 1.1.5. Error Detection Timing
1.1.4. Error Message Register x
1.1.4.1. EMR for Arria® II, Stratix® III, and Stratix® IV Devices 1.1.4.2. EMR for Arria® V, Cyclone® V, and Stratix® V Devices
1.3. Using the Error Detection CRC Feature x
1.3.1. Error Detection using User Logic 1.3.2. Error Detection using an External Host
1.3.1. Error Detection using User Logic x
1.3.1.1. Detecting CRC Errors through the CRC_ERROR Output Signal 1.3.1.2. Unloading the EMR through User Logic 1.3.1.3. Accessing the Error Detection Block through User Logic 1.3.1.4. User Logic Control Block 1.3.1.5. User Logic Control Block Signals
1.3.2. Error Detection using an External Host x
1.3.2.1. Detecting a CRC Error through the CRC_ERROR Output Signal 1.3.2.2. Unloading the EMR using an External Host
1.4. Error Injection x
1.4.1. Fault Injection Register 1.4.2. Error Injection using the EDERROR_INJECT JTAG Instruction 1.4.3. Clearing Fault Injection Register
1.4.1. Fault Injection Register x
1.4.1.1. Fault Injection for Arria® II, Stratix® III, and Stratix® IV Devices 1.4.1.2. Fault Injection for Arria® V, Cyclone® V, and Stratix® V Devices
1.4.2. Error Injection using the EDERROR_INJECT JTAG Instruction x
1.4.2.1. Injecting Single-Bit Error for Arria® II, Stratix® III, and Stratix® IV 1.4.2.2. Injecting Single-Bit Error for Arria® V, Stratix® V, and Cyclone® V Devices
1. Test Methodology of Error Detection and Recovery using CRC in Intel® FPGA Devices

1.1.5. Error Detection Timing

The CRC_ERROR pin is always set low during CRC signature calculation for a minimum of 32 clock cycles. When errors occur, the CRC_ERROR pin is set high after the EMR has been updated, or after 32 cycles, whichever comes last. Therefore, you can start to unload the contents of the EMR at the rising edge of the CRC_ERROR pin. At the end of this cycle, the CRC_ERROR pin is set low again for a minimum of 32 clock cycles. If the next frame also contains error, the CRC_ERROR pin pulls high again and the EMR is updated with the new error information.

Figure 4. Example of the CRC_ERROR Pin BehaviorExample of how the CRC_ERROR pin behaves when an error occurs in a data frame.

You can control the speed of the error detection process by setting the division factor of the clock frequency in the Intel® Quartus® Prime software. The divisor is a power of two, in which n is between one and eight. The divisor ranges from two through 256.

Figure 5. Error Detection Frequency Equation
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