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2.3.2.1. Using Simulation Signal Activity Data in Power Analysis
2.3.2.2. Signal Activities from RTL (Functional) Simulation, Supplemented by Vectorless Estimation
2.3.2.3. Signal Activities from Vectorless Estimation and User-Supplied Input Pin Activities
2.3.2.4. Signal Activities from User Defaults Only
2.5.1. Complete Design Simulation Power Analysis Flow
2.5.2. Modular Design Simulation Power Analysis Flow
2.5.3. Multiple Simulation Power Analysis Flow
2.5.4. Overlapping Simulation Power Analysis Flow
2.5.5. Partial Design Simulation Power Analysis Flow
2.5.6. Vectorless Estimation Power Analysis Flow
3.4.1. Clock Power Management
3.4.2. Pipelining and Retiming
3.4.3. Architectural Optimization
3.4.4. I/O Power Guidelines
3.4.5. Dynamically Controlled On-Chip Terminations (OCT)
3.4.6. Memory Optimization (M20K/MLAB)
3.4.7. DDR Memory Controller Settings
3.4.8. DSP Implementation
3.4.9. Reducing High-Speed Tile (HST) Usage
3.4.10. Unused Transceiver Channels
3.4.11. Periphery Power reduction XCVR Settings
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3.1.5.2. Static Probability
The static probability of a signal is the fraction of time that the signal is logic 1 during device operation. Static probability ranges from 0 (always at ground) to 1 (always at logic-high).
The static probability of input signals impacts the design's static power consumption, due to state-dependent leakage in routing and logic. This effect becomes more important for smaller geometries. In output I/O standards that drive termination resistors, the static power also depends on the static probability on I/O pins.