Intel® MAX® 10 JTAG Boundary-Scan Testing User Guide

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ID 683210
Date 11/01/2021
Public
Document Table of Contents
Document Table of Contents x
1. Intel® MAX® 10 JTAG BST Overview 2. JTAG BST Architecture 3. BST Operation Control 4. I/O Voltage Support in the JTAG Chain 5. Enabling and Disabling JTAG BST Circuitry 6. Guidelines for JTAG BST 7. Boundary-Scan Description Language Support A. Document Revision History for the Intel® MAX® 10 JTAG Boundary-Scan Testing User Guide
2. JTAG BST Architecture x
2.1. JTAG Pins 2.2. JTAG Circuitry Functional Model 2.3. JTAG Boundary-Scan Register
2.3. JTAG Boundary-Scan Register x
2.3.1. Boundary-Scan Cells in Intel® MAX® 10 I/O Pin
3. BST Operation Control x
3.1. JTAG IDCODE 3.2. JTAG Secure Mode 3.3. JTAG Private Instruction 3.4. JTAG Instructions
1. Intel® MAX® 10 JTAG BST Overview
2. JTAG BST Architecture
3. BST Operation Control
4. I/O Voltage Support in the JTAG Chain
5. Enabling and Disabling JTAG BST Circuitry
6. Guidelines for JTAG BST
7. Boundary-Scan Description Language Support
A. Document Revision History for the Intel® MAX® 10 JTAG Boundary-Scan Testing User Guide

7. Boundary-Scan Description Language Support

The BSDL—a subset of VHDL—provides a syntax that allows you to describe the features of an IEEE Std. 1149.1 BST-capable device that can be tested. Test software development systems then use the BSDL files for test generation, analysis, failure diagnostics, and in-system programming.
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