Intel® MAX® 10 JTAG Boundary-Scan Testing User Guide

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ID 683210
Date 11/01/2021
Public
Document Table of Contents
Document Table of Contents x
1. Intel® MAX® 10 JTAG BST Overview 2. JTAG BST Architecture 3. BST Operation Control 4. I/O Voltage Support in the JTAG Chain 5. Enabling and Disabling JTAG BST Circuitry 6. Guidelines for JTAG BST 7. Boundary-Scan Description Language Support A. Document Revision History for the Intel® MAX® 10 JTAG Boundary-Scan Testing User Guide
2. JTAG BST Architecture x
2.1. JTAG Pins 2.2. JTAG Circuitry Functional Model 2.3. JTAG Boundary-Scan Register
2.3. JTAG Boundary-Scan Register x
2.3.1. Boundary-Scan Cells in Intel® MAX® 10 I/O Pin
3. BST Operation Control x
3.1. JTAG IDCODE 3.2. JTAG Secure Mode 3.3. JTAG Private Instruction 3.4. JTAG Instructions
1. Intel® MAX® 10 JTAG BST Overview
2. JTAG BST Architecture
3. BST Operation Control
4. I/O Voltage Support in the JTAG Chain
5. Enabling and Disabling JTAG BST Circuitry
6. Guidelines for JTAG BST
7. Boundary-Scan Description Language Support
A. Document Revision History for the Intel® MAX® 10 JTAG Boundary-Scan Testing User Guide

1. Intel® MAX® 10 JTAG BST Overview

Intel® MAX® 10 devices support the IEEE Std.1149.1 (JTAG) boundary-scan testing (BST).

When you perform BST, you can test pin connections without using physical test probes and capture functional data during normal operation. The boundary-scan cells (BSCs) in a device can force signals onto pins, or capture data from pins or core logic signals. Forced test data is serially shifted in from the TDI pin to the BSCs. Captured data is serially shifted out to the TDO pin for external comparison with expected results.

Note: You can perform BST on Intel® MAX® 10 devices before, after, and during configuration.
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