Device Configuration User Guide: Agilex™ 5 FPGAs and SoCs

ID 813773
Date 7/24/2024
Public
Document Table of Contents

7.9. CRAM Integrity Check Feature

Agilex™ 5 devices support the CRAM integrity check feature on base configuration and partial reconfiguration for CRAM content corruption self-test. This feature is available when there is either a non-PR design or a design with a single PR region in the base design. Enabling this feature results in longer bitstream (RBF) generation time and slightly longer device configuration time.

Perform the following steps to enable and run self-testing on the CRAM integrity check feature.

  1. On the Assignments menu, click Device.
  2. In the Device and Pin Options dialog box, select the Error Detection CRC category and click the Enable CRAM Integrity Check option.
    Figure 94. Enabling CRAM Integrity Check Feature
  3. Click OK to confirm and close the Device and Pin Options dialog box.
  4. Run compilation to generate the .sof file.
  5. Configure the .sof file that enables CRAM Integrity Check feature to the device.
  6. If the CRAM Integrity Check completes without detecting any corruption, the programmer tool shows configuration is successful. However, if it fails, the error message Detected CRAM Integrity failure is reported indicating CRAM content corruption.

If the .sof file does not have the CRAM integrity check feature enabled, you can enable it by executing the command line below using the quartus_pfg with cram_integrity_check=ON argument. Configure the generated .rbf bitstream that has the feature enabled to perform the CRAM integrity check.

quartus_pfg -c -o cram_integrity_check=on fpga.sof fpga.rbf

To disable the CRAM integrity check feature, you need to uncheck the option in the Device and Pin Options dialog box and recompile the Quartus project. Simply setting the cram_integrity_check=OFF argument does not disable the feature.