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Description
Data errors are not new to the computing industry. Alpha particle induced soft errors in memory and magnetic hard drive errors have long been well researched and documented. More recently, technical papers about Silent Data Errors (SDEs) caused by a defect within the microprocessor have been published by Intel, Google, and Meta, and the topic has been discussed at industry conferences. A discussion of SDE, Intel’s test philosophy, and the Intel Data Center Diagnostics Tool will be the focus of this paper.